Principle and application of low energy inverse photoemission spectroscopy: A new method for measuring unoccupied states of organic semiconductors

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/j.elspec.2015.07.003 ◽

2015 ◽

Vol 204 ◽

pp. 116-124 ◽

Cited By ~ 37

Author(s):

Hiroyuki Yoshida

Keyword(s):

Organic Semiconductors ◽

Low Energy ◽

New Method ◽

Photoemission Spectroscopy ◽

Inverse Photoemission ◽

Inverse Photoemission Spectroscopy

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Direct and inverse photoemission spectroscopy studies of potassium intercalated films of two organic semiconductors

Applied Physics Letters ◽

10.1063/1.1595151 ◽

2003 ◽

Vol 83 (3) ◽

pp. 500-502 ◽

Cited By ~ 30

Author(s):

T. Schwieger ◽

M. Knupfer ◽

W. Gao ◽

A. Kahn

Keyword(s):

Organic Semiconductors ◽

Photoemission Spectroscopy ◽

Inverse Photoemission ◽

Spectroscopy Studies ◽

Inverse Photoemission Spectroscopy

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Ion bombardment of Ni(110) studied with inverse photoemission spectroscopy and low-energy electron diffraction

Surface Science ◽

10.1016/j.susc.2015.09.020 ◽

2016 ◽

Vol 644 ◽

pp. 64-68 ◽

Cited By ~ 1

Author(s):

Benjamin Young ◽

James Warner ◽

David Heskett

Keyword(s):

Electron Diffraction ◽

Ion Bombardment ◽

Low Energy ◽

Energy Electron ◽

Photoemission Spectroscopy ◽

Low Energy Electron Diffraction ◽

Inverse Photoemission ◽

Low Energy Electron ◽

Inverse Photoemission Spectroscopy

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Note: Low energy inverse photoemission spectroscopy apparatus

Review of Scientific Instruments ◽

10.1063/1.4860055 ◽

2014 ◽

Vol 85 (1) ◽

pp. 016101 ◽

Cited By ~ 20

Author(s):

Hiroyuki Yoshida

Keyword(s):

Low Energy ◽

Photoemission Spectroscopy ◽

Inverse Photoemission ◽

Inverse Photoemission Spectroscopy

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Low-energy inverse photoemission spectroscopy using a high-resolution grating spectrometer in the near ultraviolet range

Review of Scientific Instruments ◽

10.1063/1.4822119 ◽

2013 ◽

Vol 84 (10) ◽

pp. 103901 ◽

Cited By ~ 16

Author(s):

Hiroyuki Yoshida

Keyword(s):

High Resolution ◽

Low Energy ◽

Photoemission Spectroscopy ◽

Grating Spectrometer ◽

Near Ultraviolet ◽

Inverse Photoemission ◽

Ultraviolet Range ◽

Inverse Photoemission Spectroscopy

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Surface study of the 83-K superconductorBi2Sr2CaCu2O8by low-energy electron diffraction and angle-resolved inverse photoemission spectroscopy

Physical Review B ◽

10.1103/physrevb.39.7316 ◽

1989 ◽

Vol 39 (10) ◽

pp. 7316-7319 ◽

Cited By ~ 75

Author(s):

R. Claessen ◽

R. Manzke ◽

H. Carstensen ◽

B. Burandt ◽

T. Buslaps ◽

...

Keyword(s):

Electron Diffraction ◽

Low Energy ◽

Energy Electron ◽

Photoemission Spectroscopy ◽

Low Energy Electron Diffraction ◽

Inverse Photoemission ◽

Surface Study ◽

Low Energy Electron ◽

Inverse Photoemission Spectroscopy

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A (NH4)2Sx-treated InSb(001) surface studied by using x-ray photoelectron spectroscopy, low-energy electron diffraction, and inverse photoemission spectroscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.581602 ◽

1999 ◽

Vol 17 (2) ◽

pp. 421-424 ◽

Cited By ~ 16

Author(s):

S. Ichikawa ◽

Y. Suzuki ◽

N. Sanada ◽

N. Utsumi ◽

T. Yamaguchi ◽

...

Keyword(s):

Electron Diffraction ◽

Photoelectron Spectroscopy ◽

Low Energy ◽

Energy Electron ◽

Photoemission Spectroscopy ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Inverse Photoemission ◽

Low Energy Electron ◽

Inverse Photoemission Spectroscopy

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Near-ultraviolet inverse photoemission spectroscopy using ultra-low energy electrons

Chemical Physics Letters ◽

10.1016/j.cplett.2012.04.058 ◽

2012 ◽

Vol 539-540 ◽

pp. 180-185 ◽

Cited By ~ 82

Author(s):

Hiroyuki Yoshida

Keyword(s):

Low Energy ◽

Photoemission Spectroscopy ◽

Near Ultraviolet ◽

Inverse Photoemission ◽

Low Energy Electrons ◽

Inverse Photoemission Spectroscopy

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Unoccupied electronic structure in organic thin films studied by inverse photoemission spectroscopy

Journal of Materials Chemistry ◽

10.1039/a903578h ◽

1999 ◽

Vol 10 (1) ◽

pp. 85-89 ◽

Cited By ~ 24

Author(s):

Naoki Sato ◽

Hiroyuki Yoshida ◽

Kiyohiko Tsutsumi

Keyword(s):

Thin Films ◽

Electronic Structure ◽

Organic Thin Films ◽

Photoemission Spectroscopy ◽

Inverse Photoemission ◽

Inverse Photoemission Spectroscopy

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Photoelectron yield spectroscopy and inverse photoemission spectroscopy evaluations of p-type amorphous silicon carbide films prepared using liquid materials

AIP Advances ◽

10.1063/1.4952592 ◽

2016 ◽

Vol 6 (5) ◽

pp. 055021 ◽

Cited By ~ 2

Author(s):

Tatsuya Murakami ◽

Takashi Masuda ◽

Satoshi Inoue ◽

Hiroshi Yano ◽

Noriyuki Iwamuro ◽

...

Keyword(s):

Silicon Carbide ◽

Amorphous Silicon ◽

Photoemission Spectroscopy ◽

Amorphous Silicon Carbide ◽

Inverse Photoemission ◽

P Type ◽

Inverse Photoemission Spectroscopy

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Interaction of oxygen with polycrystalline cobalt studied by inverse-photoemission spectroscopy

Physical Review B ◽

10.1103/physrevb.47.15848 ◽

1993 ◽

Vol 47 (23) ◽

pp. 15848-15851 ◽

Cited By ~ 10

Author(s):

Lamberto Duò ◽

Marco Finazzi ◽

Franco Ciccacci ◽

Lucio Braicovich

Keyword(s):

Photoemission Spectroscopy ◽

Inverse Photoemission ◽

Inverse Photoemission Spectroscopy

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