Analysis and insight of electroluminescence imaging in the assessment of potential-induced degradation in crystalline silicon photovoltaic module

Author(s):  
Vishal E. Puranik ◽  
Rajesh Gupta
2012 ◽  
Vol 135 (2) ◽  
Author(s):  
R. Laronde ◽  
A. Charki ◽  
D. Bigaud

In this paper, a methodology is presented for estimating the lifetime of a photovoltaic (PV) module. Designers guarantee an acceptable level of power (80% of the initial power) up to 25 yr for solar panels without having sufficient feedback to validate this lifetime. Accelerated life testing (ALT) can be carried out in order to determine the lifetime of the equipment. Severe conditions are used to accelerate the ageing of components and the reliability is then deduced in normal conditions, which are considered to be stochastic rather than constant. Environmental conditions at normal operations are simulated using IEC 61725 standard and meteorological data. The mean lifetime of a crystalline-silicon photovoltaic module that meets the minimum power requirement is estimated. The main results show the influence of lifetime distribution and Peck model parameters on the estimation of the lifetime of a photovoltaic module.


Energies ◽  
2018 ◽  
Vol 11 (8) ◽  
pp. 2138 ◽  
Author(s):  
Ali Murtaza ◽  
Umer Munir ◽  
Marcello Chiaberge ◽  
Paolo Di Leo ◽  
Filippo Spertino

The correct approximation of parallel resistance (Rp) and series resistance (Rs) poses a major challenge for the single diode model of the photovoltaic module (PV). The bottleneck behind the limited accuracy of the model is the static estimation of resistive parameters. This means that Rp and Rs, once estimated, usually remain constant for the entire operating range of the same weather condition, as well as for other conditions. Another contributing factor is the availability of only standard test condition (STC) data in the manufacturer’s datasheet. This paper proposes a single-diode model with dynamic relations of Rp and Rs. The relations not only vary the resistive parameters for constant/distinct weather conditions but also provide a non-iterative solution. Initially, appropriate software is used to extract the data of current-voltage (I-V) curves from the manufacturer’s datasheet. By using these raw data and simple statistical concepts, the relations for Rp and Rs are designed. Finally, it is proved through root mean square error (RMSE) analysis that the proposed model holds a one-tenth advantage over numerous recently proposed models. Simultaneously, it is low complex, iteration-free (0 to voltage in maximum power point Vmpp range), and requires less computation time to trace the I-V curve.


2008 ◽  
Vol 16 (5) ◽  
pp. 441-453 ◽  
Author(s):  
W. G. J. H. M. van Sark ◽  
E. A. Alsema ◽  
H. M. Junginger ◽  
H. H. C. de Moor ◽  
G. J. Schaeffer

2013 ◽  
Vol 35 (5) ◽  
pp. 1118-1123 ◽  
Author(s):  
Tongxin Wang ◽  
Bo Yu ◽  
Zhijia Hu ◽  
Xin Wang ◽  
Gang Zou ◽  
...  

2013 ◽  
Vol 80 (2) ◽  
Author(s):  
E. Suhir ◽  
D. Shangguan ◽  
L. Bechou

Low-temperature thermally induced stresses in a trimaterial assembly subjected to the change in temperature are predicted based on an approximate structural analysis (strength-of-materials) analytical (“mathematical”) model. The addressed stresses include normal stresses acting in the cross-sections of the assembly components and determining their short- and long-term reliability, as well as the interfacial shearing and peeling stresses responsible for the adhesive and cohesive strength of the assembly. The model is applied to a preframed crystalline silicon photovoltaic module (PVM) assembly. It is concluded that the interfacial thermal stresses, and especially the peeling stresses, can be rather high, so that the structural integrity of the module could be compromised, unless appropriate design for reliability measures are taken. The developed model can be helpful in the stress analysis and physical (structural) design of the PVM and other trimaterial assemblies.


2012 ◽  
Vol 407 (10) ◽  
pp. 1578-1581 ◽  
Author(s):  
J.L. Crozier ◽  
E.E. van Dyk ◽  
F.J. Vorster

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