Tuning the structural and optical properties in cobalt oxide-doped borosilicate glasses

2017 ◽  
Vol 728 ◽  
pp. 773-779 ◽  
Author(s):  
Z.M. Abd El-Fattah ◽  
F. Ahmad ◽  
M.A. Hassan
Author(s):  
Nabeel A. Bakr ◽  
Sabah A. Salman ◽  
Ahmed M. Shano

In this work, nickel-cobalt oxide (Ni(1-x)CoxO) thin films, where x = 0, 4, 6 and 8 % have been successfully deposited on glass substrates by chemical spray pyrolysis (CSP) technique at substrate temperature of (400 °C) and thickness of about 300 nm. The structural and optical properties of these films have been studied using XRD, AFM, and UV-Visible spectroscopy. The XRD results showed that all films are polycrystalline in nature with cubic structure and preferred orientation along (111) plane. The crystallite size was calculated using Scherrer formula and it is found that the undoped NiO sample has maximum crystallite size (51.16 nm). AFM results showed homogenous and smooth thin films. The absorbance and transmittance spectra have been recorded in the wavelength range of (300-900) nm in order to study the optical properties. The optical energy gap for allowed direct electronic transition was calculated using Tauc equation. It is found that the band gap decreases as the Co-concentration increases and the band gap values were in the range of 3.58-3.66 eV and 3.58 eV for the prepared Nickel-Cobalt Oxide thin films. The Urbach energy increases as the Co-concentration increases and the Urbach. The optical constants including (absorption coefficient, real and imaginary parts of dielectric constant) were also calculated as a function of photon energy. Refractive index and extinction coefficient for Nickel-Cobalt Oxide thin films were estimated as a function of wavelength.


2018 ◽  
Vol 23 (3) ◽  
pp. 230-239
Author(s):  
E.P. Zaretskaya ◽  
◽  
V.F. Gremenok ◽  
A.V. Stanchik ◽  
A.N. Pyatlitski ◽  
...  

2016 ◽  
Vol 12 (3) ◽  
pp. 4394-4399
Author(s):  
Sura Ali Noaman ◽  
Rashid Owaid Kadhim ◽  
Saleem Azara Hussain

Tin Oxide and Indium doped Tin Oxide (SnO2:In) thin films were deposited on glass and Silicon  substrates  by  thermal evaporation technique.  X-ray diffraction pattern of  pure SnO2 and SnO2:In thin films annealed at 650oC and the results showed  that the structure have tetragonal phase with preferred orientation in (110) plane. AFM studies showed an inhibition of grain growth with increase in indium concentration. SEM studies of pure  SnO2 and  Indium doped tin oxide (SnO2:In) ) thin films showed that the films with regular distribution of particles and they have spherical shape.  Optical properties such as  Transmission , optical band-gap have been measured and calculated.


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