Correlation between Te inclusions and the opto-electrical properties of CdMnTe and CdMgTe single crystals

2021 ◽  
pp. 126259
Author(s):  
Pengfei Yu ◽  
Pandeng Gao ◽  
Tingquan Shao ◽  
Wenfei Liu ◽  
Biru Jiang ◽  
...  
2016 ◽  
Vol 34 (3) ◽  
pp. 487-493
Author(s):  
Hyojeong Choi ◽  
Han Soo Kim ◽  
Joon-Ho Oh ◽  
Dong Jin Kim ◽  
Young Soo Kim ◽  
...  

AbstractMicrostructural, optical and electrical properties of Cl-doped CdTe crystals grown by the low pressure Bridgman (LPB) method were investigated for four different doping concentrations (unintentionally doped, 4.97 × 1019 cm−3, 9.94 × 1019 cm−3 and 1.99 × 1020 cm−3) and three different locations within the ingots (namely, samples from top, middle and bottom positions in the order of the distance from the tip of the ingot). It was shown that Cl dopant suppressed the unwanted secondary (5 1 1) crystalline orientation. Also, the average size and surface coverage of Te inclusions decreased with an increase in Cl doping concentration. Spectroscopic ellipsometry measurements showed that the optical quality of the Cl-doped CdTe single crystals was enhanced. The resistivity of the CdTe sample doped with Cl at the 1.99 × 1020 cm−3 was above 1010 Ω.cm.


1979 ◽  
Vol 32 (3) ◽  
pp. 201-204 ◽  
Author(s):  
L. Mandel ◽  
RD Tomlinson ◽  
MJ Hampshire ◽  
H Neumann

1984 ◽  
Vol 19 (8) ◽  
pp. 989-997 ◽  
Author(s):  
J.A.K. Tareen ◽  
A. Małecki ◽  
J.P. Doumerc ◽  
J.C. Launay ◽  
P. Dordor ◽  
...  

1978 ◽  
Vol 48 (2) ◽  
pp. 329-334 ◽  
Author(s):  
I. S. Gorban ◽  
G. A. Grishchenko ◽  
A. P. Sakalas ◽  
A. S. Sodeika ◽  
I. I. Tychina ◽  
...  

1980 ◽  
Vol 19 (2) ◽  
pp. 307-315 ◽  
Author(s):  
Kunihiko Kodama ◽  
Tatsuya Niimi

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