Monitoring dynamics of defects and single Fe atoms in N-functionalized few-layer graphene by in situ temperature programmed scanning transmission electron microscopy
2008 ◽
Vol 14
(S2)
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pp. 436-437
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2018 ◽
Vol 18
(9)
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pp. 5434-5440
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2021 ◽
2020 ◽
Vol 124
(27)
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pp. 14935-14940