Temperature-Dependent Ultrastructure Transformation of Au–Fe Nanoparticles Investigated by in Situ Scanning Transmission Electron Microscopy

Temperature Dependent ◽

Transmission Electron ◽

Fe Nanoparticles ◽

Atomic-resolution Studies of Ca3Co4O9 using in-situ Scanning Transmission Electron Microscopy

10.1017/s1431927608083499 ◽

2008 ◽

Vol 14 (S2) ◽

pp. 436-437 ◽

Cited By ~ 1

Author(s):

G Yang ◽

Y Zhao ◽

K Sader ◽

A Bleloch ◽

RF Klie

Keyword(s):

Electron Microscopy ◽

New Mexico ◽

Atomic Resolution ◽

Transmission Electron ◽

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Tracking oxidation of individual iron nanoparticles with atomic resolution using aberration-corrected environmental in situ scanning transmission electron microscopy

10.22443/rms.emc2020.1388 ◽

2021 ◽

Author(s):

Roland Kröger ◽

Keyword(s):

Electron Microscopy ◽

Iron Nanoparticles ◽

Atomic Resolution ◽

Transmission Electron ◽

Scanning Transmission ◽

Aberration Corrected

Atomic-Scale Localized Thinning and Reconstruction of Two-Dimensional WS2 Layers through In Situ Transmission Electron Microscopy/Scanning Transmission Electron Microscopy

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.0c04765 ◽

2020 ◽

Vol 124 (27) ◽

pp. 14935-14940

Author(s):

Yi-Tang Tseng ◽

Kuo-Lun Tai ◽

Chun-Wei Huang ◽

Chih-Yang Huang ◽

Wen-Wei Wu

Keyword(s):

Electron Microscopy ◽

Atomic Scale ◽

Two Dimensional ◽

Transmission Electron ◽

Atomic‐Scale Fabrication of In‐Plane Heterojunctions of Few‐Layer MoS 2 via In Situ Scanning Transmission Electron Microscopy

Small ◽

10.1002/smll.201905516 ◽

2019 ◽

Vol 16 (3) ◽

pp. 1905516 ◽

Cited By ~ 4

Author(s):

Kuo‐Lun Tai ◽

Chun‐Wei Huang ◽

Ren‐Fong Cai ◽

Guan‐Min Huang ◽

Yi‐Tang Tseng ◽

...

Keyword(s):

Electron Microscopy ◽

Atomic Scale ◽

Transmission Electron ◽

In situ Scanning/Transmission Electron Microscopy and Spectroscopy of Local Ionic Transport in Battery Electrodes

10.1017/s1431927619010961 ◽

2019 ◽

Vol 25 (S2) ◽

pp. 2046-2047

Author(s):

Feng Wang

Keyword(s):

Electron Microscopy ◽

Ionic Transport ◽

Transmission Electron ◽

Four Dimensional Scanning Transmission Electron Microscopy during the in situ Annealing of a CuZrAl Bulk Metallic Glass

10.1017/s1431927619008080 ◽

2019 ◽

Vol 25 (S2) ◽

pp. 1470-1471

Author(s):

Thomas C. Pekin ◽

Christoph Gammer ◽

Colin Ophus ◽

Robert O. Ritchie ◽

Andrew M. Minor

Keyword(s):

Electron Microscopy ◽

Metallic Glass ◽

Bulk Metallic Glass ◽

Transmission Electron ◽

In Situ Scanning Transmission Electron Microscopy Observations of Fracture at the Atomic Scale

Physical Review Letters ◽

10.1103/physrevlett.125.246102 ◽

2020 ◽

Vol 125 (24) ◽

Cited By ~ 1

Author(s):

Lingli Huang ◽

Fangyuan Zheng ◽

Qingming Deng ◽

Quoc Huy Thi ◽

Lok Wing Wong ◽

...

Keyword(s):

Electron Microscopy ◽

Atomic Scale ◽

Transmission Electron ◽

In-situ Scanning Transmission Electron Microscopy Annealing Studies of Ni1-xCrx Nanocluster and Correlation with Magnetic Properties

10.1017/s1431927614010058 ◽

2014 ◽

Vol 20 (S3) ◽

pp. 1664-1665

Author(s):

Rosa E. Diaz ◽

Murtaza Bohra ◽

Vidyadhar Singh ◽

Mukhles Sowwan

Keyword(s):

Electron Microscopy ◽

Magnetic Properties ◽

Transmission Electron ◽

Corrigendum to ‘Monitoring dynamics of defects and single Fe atoms in N-functionalized few-layer graphene by in situ temperature programmed scanning transmission electron microscopy’ [JECHEM 64 (2022) 520-530]

Journal of Energy Chemistry ◽

10.1016/j.jechem.2021.08.003 ◽

2021 ◽

Author(s):

Rosa Arrigo ◽

Takeo Sasaki ◽

June Callison ◽

Diego Gianolio ◽

Manfred Erwin Schuster

Keyword(s):

Electron Microscopy ◽

Layer Graphene ◽

Transmission Electron ◽

Scanning Transmission ◽

Temperature Programmed ◽

Few Layer Graphene

Visualising reacting single atoms under controlled conditions: Advances in atomic resolution in situ Environmental (Scanning) Transmission Electron Microscopy (E(S)TEM)

Comptes Rendus Physique ◽

10.1016/j.crhy.2014.01.002 ◽

2014 ◽

Vol 15 (2-3) ◽

pp. 200-213 ◽

Cited By ~ 30

Author(s):

Edward D. Boyes ◽

Pratibha L. Gai

Keyword(s):

Electron Microscopy ◽

Atomic Resolution ◽

Environmental Scanning ◽

Single Atoms ◽

Transmission Electron ◽