Rapid determination of partition and diffusion properties for salt and aroma compounds in complex food matrices

2009 ◽  
Vol 93 (4) ◽  
pp. 407-415 ◽  
Author(s):  
Clémentine Lauverjat ◽  
Clément de Loubens ◽  
Isabelle Déléris ◽  
Ioan Cristian Tréléa ◽  
Isabelle Souchon
2018 ◽  
Vol 45 (1) ◽  
pp. 1-10
Author(s):  
Marija Ćorović ◽  
Ana Milivojević ◽  
Milica Carević ◽  
Katarina Banjanac ◽  
Ljubodrag Vujisić ◽  
...  

1999 ◽  
Vol 41 (3-4) ◽  
pp. 209-214 ◽  
Author(s):  
F. Ruiz-Beviá ◽  
J. Fernández-Sempere ◽  
A. Gómez-Siurana ◽  
E. Torregrosa-Fuerte

Author(s):  
T. Y. Tan ◽  
W. K. Tice

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.


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