Trace metal contamination of the aquatic plant Hydrilla verticillata and associated sediment in a coastal Alabama creek (Gulf of Mexico – USA)

2013 ◽  
Vol 68 (1-2) ◽  
pp. 147-151 ◽  
Author(s):  
C. Lafabrie ◽  
K.M. Major ◽  
C.S. Major ◽  
J. Cebrián
2016 ◽  
Vol 75 (2) ◽  
pp. 236-243 ◽  
Author(s):  
Dragana Petrović ◽  
Dejan Jančić ◽  
Martina Furdek ◽  
Nevenka Mikac ◽  
Slađana Krivokapić

Abstract Skadar Lake is the largest shallow lake in southeastern Europe. It is located within a national park, and is included in the Ramsar List of international important wetlands, so its preservation and protection from pollution is very important. The aim of this study was to investigate bioaccumulation of the ecotoxic metals Cd, Pb and Cr from sediments of Skadar Lake in the aquatic macrophyte Trapa natans L. Samples of sediment and plants were collected at nine locations covering all major water inputs to the lake as well as locations where contamination could be expected. The obtained results indicate that sediments from the Skadar Lake are only locally contaminated with Cd (0.03–1.18 mg kg−1), generally contaminated with Cr (15.8–180 mg kg−1), the concentrations of both elements frequently exceeding sediment quality guidelines, while concentrations of Pb were low (2.7–17.4 mg kg−1). The highest bioaccumulation of all metals from sediment to Trapa natans L. was observed in the root, with accumulation efficiency decreasing in the order Cd > Cr > Pb. Translocation from root to stem was also higher for Cd than for Cr and Pb, while the translocation from stem to leaf was comparable for all three metals. From the three investigated metals Cd showed the highest mobility. The results indicate that Trapa natans L. may be a very promising bioindicator of trace metal contamination in Skadar Lake.


Author(s):  
Yasunori Goto ◽  
Hiroomi Eguchi ◽  
Masaru Iida

Abstract In the automotive IC using thick-film silicon on insulator (SOI) semiconductor device, if the gettering capability of a SOI wafer is inadequate, electrical characteristics degradation by metal contamination arises and the yield falls. At this time, an automotive IC was made experimentally for evaluation of the gettering capability as one of the purposes. In this IC, one of the output characteristics varied from the standard, therefore failure analysis was performed, which found trace metal elements as one of the causes. By making full use of 3D perspective, it is possible to fabricate a site-specific sample into 0.1 micrometre in thickness without missing a failure point that has very minute quantities of contaminant in a semiconductor device. Using energy dispersive X-ray, it is possible to detect trace metal contamination at levels 1E12 atoms per sq cm. that are conventionally detected only by trace element analysis.


2020 ◽  
Vol 35 ◽  
pp. 101143
Author(s):  
Michele Fernandes ◽  
Estefan Monteiro da Fonseca ◽  
Leonardo da Silva Lima ◽  
Susanna Eleonora Sichel ◽  
Jessica de Freitas Delgado ◽  
...  

2017 ◽  
Vol 51 (8) ◽  
pp. 4173-4181 ◽  
Author(s):  
Robert J. Rossi ◽  
Daniel J. Bain ◽  
Aubrey L. Hillman ◽  
David P. Pompeani ◽  
Matthew S. Finkenbinder ◽  
...  

2007 ◽  
Vol 18 (6) ◽  
pp. 1194-1206 ◽  
Author(s):  
Cassia O. Farias ◽  
Claudia Hamacher ◽  
Angela de Luca R. Wagener ◽  
Reinaldo C. de Campos ◽  
José M. Godoy

Sign in / Sign up

Export Citation Format

Share Document