Characterization of surface films formed on molten magnesium in atmospheres containing SO2

2012 ◽  
Vol 135 (2-3) ◽  
pp. 541-548 ◽  
Author(s):  
Xian-Fei Wang ◽  
Shou-Mei Xiong
Keyword(s):  
Surface Films ◽  
Molten Magnesium

Characterization of Surface Films Formed During Corrosion of a Pipeline Steel in H2S Environments

2017 ◽  
Vol 26 (2) ◽  
pp. 828-836 ◽  
Author(s):  
F. Huang ◽  
P. Cheng ◽  
Y. Y. Dong ◽  
J. Liu ◽  
Q. Hu ◽  
...  
Keyword(s):  
Pipeline Steel ◽  
Surface Films

Characterisation of the surface films formed on molten magnesium in different protective atmospheres

2002 ◽  
Vol 332 (1-2) ◽  
pp. 285-294 ◽  
Author(s):  
Gunnar Pettersen ◽  
E Øvrelid ◽  
G Tranell ◽  
J Fenstad ◽  
H Gjestland
Keyword(s):  
Surface Films ◽  
Protective Atmospheres ◽  
Molten Magnesium

Multipurpose x-ray reflectometer optimized for the characterization of organic surface films on aqueous subphases

2001 ◽  
Vol 72 (1) ◽  
pp. 184-192 ◽  
Author(s):  
P. Krüger ◽  
M. Schalke ◽  
J. Linderholm ◽  
M. Lösche
Keyword(s):  
Surface Films ◽  
X Ray

Characterization of Chemical/Mechanical Properties of Surface Films in Copper CMP

2015 ◽  
Vol 4 (11) ◽  
pp. P5043-P5052 ◽  
Author(s):  
Francis Bryan ◽  
Michael Clark ◽  
Gregory Muldowney ◽  
Ravichandra Palaparthi
Keyword(s):  
Mechanical Properties ◽  
Surface Films ◽  
Copper Cmp

Infrared Emission Spectroscopy. I. Basic Considerations

1972 ◽  
Vol 26 (1) ◽  
pp. 73-76 ◽  
Author(s):  
Peter R. Griffiths
Keyword(s):  
High Pressure ◽  
Emission Spectroscopy ◽  
Infrared Emission ◽  
Thin Layers ◽  
Surface Films ◽  
Silicone Grease ◽  
Basic Principles ◽  
Ir Emission ◽  
Thick Layers

The basic principles behind the characterization of compounds by ir emission spectroscopy have been illustrated using surface films of silicone grease and gaseous samples. Anomalous features in the spectra are accounted for by considering the absorption of emitted radiation by less thermally excited molecules in the path to the detector. It is suggested that ir emission spectroscopy can be used easily to characterize thin layers on heated specular mirrors or hot vapors at low pressure, but care must be taken in the interpretation of results for thick layers of gases at high pressure, when the temperature of the emitter is close to that of the detector, or when molecules are to be characterized on substrates whose emissivity is high.

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