Effect of helium gas pressure on dc conduction mechanism and EMI shielding properties of nanocrystalline carbon thin films

We have studied the effects of ambient Helium gas pressure on the optical, structural and physical properties of the diamond like carbon thin films using a camphoric carbon (CC) soot target, deposited by pulsed laser ablation. Both the optical gap and electrical resistivity are found to increase with 2.6 Torr leads to a decre ase in optical gap and electrical resistivity. The films are further investigated by different spectroscopic techniques such as, Raman, XPS and FTIR spectroscopy, and surface morphological techniques like SEM and AFM. Improvement of the opto-electrical and structural properties of the diamondlike carbonaceous films deposited in helium environment using CC soot target reveal different behaviour than reported earlier.

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Study of variable range hopping conduction mechanism in nanocrystalline carbon thin films deposited by modified anodic jet carbon arc technique: application to light-dependent resistors

Journal of Materials Science Materials in Electronics ◽

10.1007/s10854-020-05020-z ◽

2021 ◽

Author(s):

Ravi Kant Tripathi ◽

O. S. Panwar ◽

Ishpal Rawal ◽

C. K. Dixit ◽

Arpit Verma ◽

...

Keyword(s):

Thin Films ◽

Conduction Mechanism ◽

Hopping Conduction ◽

Variable Range Hopping ◽

Variable Range ◽

Carbon Arc ◽

Carbon Thin Films ◽

Variable Range Hopping Conduction

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ITO/Au/ITO multilayer thin films on transparent polycarbonate with enhanced EMI shielding properties

Current Applied Physics ◽

10.1016/j.cap.2020.01.012 ◽

2020 ◽

Vol 20 (4) ◽

pp. 489-497 ◽

Cited By ~ 2

Author(s):

Nursev Erdogan ◽

Fuat Erden ◽

A. Taner Astarlioglu ◽

Mehtap Ozdemir ◽

Salih Ozbay ◽

...

Keyword(s):

Thin Films ◽

Multilayer Thin Films ◽

Emi Shielding ◽

Shielding Properties

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Effects of gas pressure and r.f. power on the growth and properties of magnetron sputter deposited amorphous carbon thin films

Diamond and Related Materials ◽

10.1016/s0925-9635(01)00544-1 ◽

2002 ◽

Vol 11 (3-6) ◽

pp. 1005-1009 ◽

Cited By ~ 32

Author(s):

J.L. Andújar ◽

F.J. Pino ◽

M.C. Polo ◽

A. Pinyol ◽

C. Corbella ◽

...

Keyword(s):

Thin Films ◽

Amorphous Carbon ◽

Gas Pressure ◽

Magnetron Sputter ◽

Carbon Thin Films ◽

Sputter Deposited

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Electron energy loss spectroscopy of diamond-like carbon thin films

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100130997 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1272-1273

Author(s):

J. Kulik ◽

Y. Lifshitz ◽

G.D. Lempert ◽

S. Rotter ◽

J.W. Rabalais ◽

...

Keyword(s):

Thin Films ◽

Energy Loss ◽

Electron Energy ◽

Ion Beam ◽

Diamond Like Carbon ◽

Ion Beam Deposition ◽

Chemistry Research ◽

Carbon Thin Films ◽

Electron Energy Loss ◽

Beam Deposition

Carbon thin films with diamond-like properties have generated significant interest in condensed matter science in recent years. Their extreme hardness combined with insulating electronic characteristics and high thermal conductivity make them attractive for a variety of uses including abrasion resistant coatings and applications in electronic devices. Understanding the growth and structure of such films is therefore of technological interest as well as a goal of basic physics and chemistry research. Recent investigations have demonstrated the usefulness of energetic ion beam deposition in the preparation of such films. We have begun an electron microscopy investigation into the microstructure and electron energy loss spectra of diamond like carbon thin films prepared by energetic ion beam deposition.The carbon films were deposited using the MEIRA ion beam facility at the Soreq Nuclear Research Center in Yavne, Israel. Mass selected C+ beams in the range 50 to 300 eV were directed onto Si {100} which had been etched with HF prior to deposition.

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Electron-diffraction studies of amorphous carbon thin films

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100151337 ◽

1993 ◽

Vol 51 ◽

pp. 1100-1101

Author(s):

David A. Muller

Keyword(s):

Thin Films ◽

Electron Diffraction ◽

Amorphous Carbon ◽

Glassy Carbon ◽

Spherical Structure ◽

Local Ordering ◽

Carbon Arc ◽

Similar Appearance ◽

Carbon Thin Films ◽

Large Spherical

The sp2 rich amorphous carbons have a wide variety of microstructures ranging from flat sheetlike structures such as glassy carbon to highly curved materials having similar local ordering to the fullerenes. These differences are most apparent in the region of the graphite (0002) reflection of the energy filtered diffracted intensity obtained from these materials (Fig. 1). All these materials consist mainly of threefold coordinated atoms. This accounts for their similar appearance above 0.8 Å-1. The fullerene curves (b,c) show a string of peaks at distance scales corresponding to the packing of the large spherical and oblate molecules. The beam damaged C60 (c) shows an evolution to the sp2 amorphous carbons as the spherical structure is destroyed although the (220) reflection in fee fcc at 0.2 Å-1 does not disappear completely. This 0.2 Å-1 peak is present in the 1960 data of Kakinoki et. al. who grew films in a carbon arc under conditions similar to those needed to form fullerene rich soots.

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