Growth direction and exposed facets of Cu/Cu2O nanostructures affect product selectivity in CO2 electroreduction

Author(s):  
Carmen Castro-Castillo ◽  
Kamala Kanta Nanda ◽  
Elías Mardones-Herrera ◽  
Valeria Gazzano ◽  
Domingo Ruiz-León ◽  
...  
2016 ◽  
Vol 18 (14) ◽  
pp. 9652-9657 ◽  
Author(s):  
Seoin Back ◽  
Jun-Hyuk Kim ◽  
Yong-Tae Kim ◽  
Yousung Jung

To understand a high selectivity for HCOOH on the Pb electrode during the CO2 reduction reaction, we suggest a proton-assisted-electron-transfer mechanism, and validate the new mechanism by experimentally measuring onset potentials for CO2 reduction vs. H2 production. We find that the origin of this high selectivity lies in the strong O-affinitive and weak C-, H-affinitive characteristics of Pb.


Author(s):  
Xing Zhi ◽  
Yan Jiao ◽  
Yao Zheng ◽  
Kenneth Davey ◽  
Shi-Zhang Qiao

Understanding the late stages of C2 pathways provides great opportunities for fully achieving a selective CO2 electroreduction. The C2 product selectivity can be directed by the active site's oxygen affinity on a range of non-metal doped Cu surfaces.


ChemSusChem ◽  
2017 ◽  
Vol 10 (22) ◽  
pp. 4642-4649 ◽  
Author(s):  
Xingli Wang ◽  
Ana Sofia Varela ◽  
Arno Bergmann ◽  
Stefanie Kühl ◽  
Peter Strasser

Small ◽  
2017 ◽  
Vol 14 (7) ◽  
pp. 1703314 ◽  
Author(s):  
Wenjin Zhu ◽  
Lei Zhang ◽  
Piaoping Yang ◽  
Xiaoxia Chang ◽  
Hao Dong ◽  
...  

Author(s):  
Z.L. Wang ◽  
J. Bentley ◽  
R.E. Clausing ◽  
L. Heatherly ◽  
L.L. Horton

Microstructural studies by transmission electron microscopy (TEM) of diamond films grown by chemical vapor deposition (CVD) usually involve tedious specimen preparation. This process has been avoided with a technique that is described in this paper. For the first time, thick as-grown diamond films have been examined directly in a conventional TEM without thinning. With this technique, the important microstructures near the growth surface have been characterized. An as-grown diamond film was fractured on a plane containing the growth direction. It took about 5 min to prepare a sample. For TEM examination, the film was tilted about 30-45° (see Fig. 1). Microstructures of the diamond grains on the top edge of the growth face can be characterized directly by transmitted electron bright-field (BF) and dark-field (DF) images and diffraction patterns.


Author(s):  
S. McKernan ◽  
C. B. Carter ◽  
D. Bour ◽  
J. R. Shealy

The growth of ternary III-V semiconductors by organo-metallic vapor phase epitaxy (OMVPE) is widely practiced. It has been generally assumed that the resulting structure is the same as that of the corresponding binary semiconductors, but with the two different cation or anion species randomly distributed on their appropriate sublattice sites. Recently several different ternary semiconductors including AlxGa1-xAs, Gaxln-1-xAs and Gaxln1-xP1-6 have been observed in ordered states. A common feature of these ordered compounds is that they contain a relatively high density of defects. This is evident in electron diffraction patterns from these materials where streaks, which are typically parallel to the growth direction, are associated with the extra reflections arising from the ordering. However, where the (Ga,ln)P epilayer is reasonably well ordered the streaking is extremely faint, and the intensity of the ordered spot at 1/2(111) is much greater than that at 1/2(111). In these cases it is possible to image relatively clearly many of the defects found in the ordered structure.


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