scholarly journals Achieving ultra-large elastic strains in Nb thin films on NiTi phase-transforming substrate by the principle of lattice strain matching

2021 ◽  
Vol 197 ◽  
pp. 109257
Author(s):  
Fakhrodin Motazedian ◽  
Junsong Zhang ◽  
Zhigang Wu ◽  
Daqiang Jiang ◽  
Satyajit Sarkar ◽  
...  
2004 ◽  
Vol 84 (5) ◽  
pp. 777-779 ◽  
Author(s):  
Y. P. Lee ◽  
S. Y. Park ◽  
V. G. Prokhorov ◽  
V. A. Komashko ◽  
V. L. Svetchnikov

2020 ◽  
Vol 2020 ◽  
pp. 1-10
Author(s):  
Panya Khaenamkaew ◽  
Dhonluck Manop ◽  
Chaileok Tanghengjaroen ◽  
Worasit Palakawong Na Ayuthaya

The electrical properties of tin dioxide (SnO2) nanoparticles induced by low calcination temperature were systematically investigated for gas sensing applications. The precipitation method was used to prepare SnO2 powders, while the sol-gel method was adopted to prepare SnO2 thin films at different calcination temperatures. The characterization was done by X-ray diffraction, scanning electron microscopy (SEM), and atomic force microscopy (AFM). The samples were perfectly matched with the rutile tetragonal structure. The average crystallite sizes of SnO2 powders were 45 ± 2, 50 ± 2, 62 ± 2, and 65 ± 2 nm at calcination temperatures of 300, 350, 400, and 450°C, respectively. SEM images and AFM topographies showed an increase in particle size and roughness with the rise in calcination temperature. The dielectric constant decreased with the increase in the frequency of the applied signals but increased on increasing calcination temperature. By using the UV-Vis spectrum, the direct energy bandgaps of SnO2 thin films were found as 4.85, 4.80, 4.75, and 4.10 eV for 300, 350, 400, and 450°C, respectively. Low calcination temperature as 300°C allows smaller crystallite sizes and lower dielectric constants but increases the surface roughness of SnO2, while lattice strain remains independent. Thus, low calcination temperatures of SnO2 are promising for electronic devices like gas sensors.


1998 ◽  
Vol 72 (8) ◽  
pp. 981-983 ◽  
Author(s):  
Y. G. Zhao ◽  
Z. W. Dong ◽  
M. Rajeswari ◽  
R. P. Sharma ◽  
T. Venkatesan

2015 ◽  
Vol 51 (11) ◽  
pp. 1-4
Author(s):  
Y. Y. Zhao ◽  
J. Wang ◽  
F. X. Hu ◽  
H. Kuang ◽  
Y. Liu ◽  
...  

2006 ◽  
Vol 21 (1) ◽  
pp. 25-29 ◽  
Author(s):  
E. Eiper ◽  
K. J. Martinschitz ◽  
J. Keckes

This work introduces a new simple approach to determine experimental X-ray elastic constants (XECs) of thin films by coupling the sin2ψ method and the substrate curvature technique. The approach is demonstrated on polycrystalline Cu thin films with the thickness 200, 800, and 2400 nm deposited on Si(100) substrates. Applying synchrotron radiation, the elastic strains in the films are determined using sin2ψ method while the macroscopic stresses are assessed by measuring the substrate curvature. The stresses are calculated using the Stoney formula from the radius of substrate curvature determined by the rocking curve measurement of substrate 400 reflection at different sample positions. Results show that the magnitude of the macroscopic stress in the films is proportional to the magnitude of the slope in the sin2ψ plots. On the basis of this observation, XECs of the films were calculated showing no dependence on the film thickness. The characterization of the samples was performed at the synchrotron source Hasylab.


Sign in / Sign up

Export Citation Format

Share Document