Influences of vacuum annealing induced oxygen defects on the transfer characteristics of a-ITO Thin-Film transistors
Keyword(s):
1995 ◽
Vol 34
(Part 1, No. 11)
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pp. 5943-5948
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Keyword(s):
2015 ◽
Vol 10
(4)
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pp. 520-523
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Keyword(s):
2018 ◽
Vol 13
(7)
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pp. 1102-1105