Tailoring the structural, optical and multiferroic properties of low temperature synthesized cobalt ferrite nanomaterials, by citrate precursor method

2021 ◽  
Author(s):  
Shashank Bhushan Das ◽  
Rakesh Kumar Singh ◽  
Vivek Kumar ◽  
Nishant Kumar ◽  
Shambhu Kumar
Keyword(s):  
Low Temperature ◽  
Cobalt Ferrite ◽  
Precursor Method ◽  
Multiferroic Properties ◽  
Citrate Precursor ◽  
Citrate Precursor Method

Low Temperature Electrode Materials Synthesized by Citrate Precursor Method for Solid Oxide Fuel Cells

Fuel Cells ◽  
2013 ◽  
Vol 13 (2) ◽  
pp. 270-278 ◽  
Author(s):  
M. A. Nath ◽  
A. S. Hameed ◽  
R. Chockalingam ◽  
S. Basu ◽  
A. K. Ganguli
Keyword(s):  
Fuel Cells ◽  
Low Temperature ◽  
Solid Oxide Fuel Cells ◽  
Electrode Materials ◽  
Solid Oxide ◽  
Oxide Fuel ◽  
Precursor Method ◽  
Citrate Precursor ◽  
Citrate Precursor Method

COMPARATIVE STUDY OF DIELECTRIC BEHAVIOR OF Mn0.4Zn0.6Fe2O4 NANOFERRITE BY CITRATE PRECURSOR METHOD

2008 ◽  
Vol 22 (16) ◽  
pp. 2537-2544 ◽  
Author(s):  
PREETI MATHUR ◽  
ATUL THAKUR ◽  
M. SINGH
Keyword(s):  
Particle Size ◽  
Dielectric Constant ◽  
Comparative Study ◽  
Average Particle Size ◽  
Dielectric Behavior ◽  
Average Particle ◽  
Oxidizing Agent ◽  
Precursor Method ◽  
Citrate Precursor ◽  
Citrate Precursor Method

In the present work, comparative study of the dielectric behavior of Mn 0.4 Zn 0.6 Fe 2 O 4 ferrite synthesized with and without H 2 O 2 (hydrogen peroxide) has been presented. The dc resistivity has been improved by the citrate precursor method as compared to the ceramic method, and it is further improved by the addition of H 2 O 2, which acts as a strong oxidizing agent. We have shown by means of X-ray diffraction that the resulting ferrite is made up of nanocrystallites and the average size of these nanocrystallites–calculated by Scherrer's formula–depends on the polarizer. The average particle size was found to be ~70 nm with H 2 O 2 and ~88 nm without H 2 O 2. The particle size is further confirmed by scanning electron microscopy. Both the results are found to be in good agreement. The decrease in dielectric constant and dielectric loss factor by addition of oxidizing agent is justified by inverse proportionality between the resistivity and dielectric constant. Possible mechanisms contributing to these processes have been discussed.

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