Experimental investigation of electromigration failure in Cu–Sn–Cu micropads in 3D integrated circuits

2014 ◽  
Vol 122 ◽  
pp. 46-51 ◽  
Author(s):  
Zhihong Huang ◽  
Robert E. Jones ◽  
Ankur Jain
Author(s):  
Fatemeh Tavakkoli ◽  
Siavash Ebrahimi ◽  
Shujuan Wang ◽  
Kambiz Vafai

Author(s):  
Yuanqing Cheng ◽  
Aida Todri-Sanial ◽  
Alberto Bosio ◽  
Luigi Dilillo ◽  
Patrick Girard ◽  
...  

Author(s):  
Khaled Salah ◽  
Yehea Ismail ◽  
Alaa El-Rouby

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