An ultra-low-power CMOS voltage reference generator based on body bias technique

2013 ◽  
Vol 44 (12) ◽  
pp. 1145-1153 ◽  
Author(s):  
Yanhan Zeng ◽  
Yirong Huang ◽  
Yunling Luo ◽  
Hong-Zhou Tan
2014 ◽  
Vol 81 (1) ◽  
pp. 313-324 ◽  
Author(s):  
Liangbo Xie ◽  
Jiaxin Liu ◽  
Yao Wang ◽  
Yu Han ◽  
Guangjun Wen

2013 ◽  
Vol E96.C (6) ◽  
pp. 859-866
Author(s):  
Hao ZHANG ◽  
Mengshu HUANG ◽  
Yimeng ZHANG ◽  
Tsutomu YOSHIHARA

2007 ◽  
Vol E90-C (10) ◽  
pp. 2044-2050 ◽  
Author(s):  
L. H.C. FERREIRA ◽  
T. C. PIMENTA ◽  
R. L. MORENO

2013 ◽  
Vol 10 (8) ◽  
pp. 20130154-20130154 ◽  
Author(s):  
Yanhan Zeng ◽  
Yunling Luo ◽  
Jun Zhang ◽  
Zhuqian Gong ◽  
Hong-Zhou Tan

Author(s):  
Mohammadreza Rasekhi ◽  
Emad Ebrahimi ◽  
Hamed Aminzadeh

In this paper, an ultra-low power CMOS voltage reference capable of operating at sub-1[Formula: see text]V input supply is proposed. Four transistors biased in weak inversion are used to generate the required complementary-to-absolute-temperature (CTAT) and proportional-to-absolute-temperature (PTAT) voltages of the proposed circuit. Self-biasing of nature of the proposed configuration in the form of operational amplifier (opamp)-free ensure nano-power operation and eliminate the need for lateral bipolar junction transistors (BJTs) and offset cancelation techniques. A prototype of the circuit is designed and simulated in a standard 0.18-[Formula: see text]m CMOS process. Post-layout simulation results show that the circuit generates a reference voltage of 494[Formula: see text]mV with temperature coefficient (TC) of 58.4[Formula: see text]ppm/∘C across [Formula: see text]C to 85∘C; while the consuming power is lowered to 3.48[Formula: see text]nW at the minimum supply of 0.8[Formula: see text]V. The line sensitivity is 0.7%/V for the supply voltages from 0.8[Formula: see text]V to 1.8[Formula: see text]V, whereas the power supply ripple rejection (PSRR) is [Formula: see text]49.06[Formula: see text]dB at 1[Formula: see text]Hz. Monte Carlo simulation results of the voltage reference show a mean value of 497.2[Formula: see text]mV with [Formula: see text]/[Formula: see text] of 1.7%, demonstrating the robustness of the generated reference voltage against the process variations and mismatch.


2006 ◽  
Vol 37 (10) ◽  
pp. 1072-1079 ◽  
Author(s):  
Giuseppe De Vita ◽  
Giuseppe Iannaccone

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