Improving the energy resolution of X-ray and electron energy-loss spectra

Micron ◽  
2006 ◽  
Vol 37 (4) ◽  
pp. 310-315 ◽  
Author(s):  
R.F. Egerton ◽  
H. Qian ◽  
M. Malac
Author(s):  
Eckhard Quandt ◽  
Stephan laBarré ◽  
Andreas Hartmann ◽  
Heinz Niedrig

Due to the development of semiconductor detectors with high spatial resolution -- e.g. charge coupled devices (CCDs) or photodiode arrays (PDAs) -- the parallel detection of electron energy loss spectra (EELS) has become an important alternative to serial registration. Using parallel detection for recording of energy spectroscopic large angle convergent beam patterns (LACBPs) special selected scattering vectors and small detection apertures lead to very low intensities. Therefore the very sensitive direct irradiation of a cooled linear PDA instead of the common combination of scintillator, fibre optic, and semiconductor has been investigated. In order to obtain a sufficient energy resolution the spectra are optionally magnified by a quadrupole-lens system.The detector used is a Hamamatsu S2304-512Q linear PDA with 512 diodes and removed quartz-glas window. The sensor size is 13 μm ∗ 2.5 mm with an element spacing of 25 μm. Along with the dispersion of 3.5 μm/eV at 40 keV the maximum energy resolution is limited to about 7 eV, so that a magnification system should be attached for experiments requiring a better resolution.


Author(s):  
J. Taftø ◽  
O. L. Krivanek

Bragg reflection of electrons gives rise to a modulation of the wavefield over the crystal unit cell. Depending on the incident beam direction the electrons may be concentrated at one or another type of atoms or between them. Localized ionization processes will therefore show an orientation dependence, and this will affect the X-ray emission intensities as well as electron energy loss spectra. The energy loss case gives more possibilities for experimental arrangements than the X-ray emission case, in that the direction of not only the incident electron beam, but also that of the exit beam to be analyzed may be selected.Natural MgAl2O4 spinel was studied. The crystals were ground in a mortar and thin areas were analyzed with a Gatan 607 spectrometer attached to a Philips 400T electron microscope operating at lOOkV. The experiments were done for the (400)-planar case where the main atomic planes contain Al2O4. The Mg-atoms are midway between the A12O4 and may be considered as interstitials in this planar case.


Author(s):  
J. Bihr ◽  
A. Rilk ◽  
W.I. Miller

An imaging electron energy loss spectrometer can be used to produce elemental maps with highest spatial resolution by Electron Spectroscopic Imaging (ESI). Simultaneously, electron energy loss spectra (EELS) can also be recorded. It is therefore simple to combine morphological examinations with the analytical method of electron energy loss spetroscopy (Figs. 2, 3)The electron energy loss spectrometer of the EM 902, used in combination with a suitable electron detector (Fig. 1), provides the possibility of recording electron energy loss spectra over an energy loss range from 0 to 2000 eV. In this way, all elements of the periodic system can be detected via their K, L, M, N or O absorption edges (Fig. 5). Unlike X-ray microanalysis, this technique is especially suitable for detecting light and medium-heavy elements which are of special significance in biological and medical research.


1983 ◽  
Vol 28 (2) ◽  
pp. 123-133 ◽  
Author(s):  
I.M. Curelaru ◽  
E. Suonien ◽  
E. Minni ◽  
K.-G. Strid ◽  
T. Rönnhult

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