Comparison of the X-ray photoelectron and electron-energy-loss spectra of the nitrogen-doped hydrogenated amorphous carbon bond

2003 ◽  
Vol 83 (16) ◽  
pp. 1937-1947 ◽  
Author(s):  
D. A. Zeze ◽  
S. R. P. Silva ◽  
S. Haq ◽  
S. J. Harris
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Amorphous Carbon ◽  
Carbon Bond ◽  
X Ray ◽  
Hydrogenated Amorphous Carbon ◽  
Nitrogen Doped ◽  
Electron Energy Loss ◽  
Hydrogenated Amorphous ◽  
Electron Energy Loss Spectra

The Combined Effect of Channelling and Blocking in Electron Energy Loss Spectroscopy

1981 ◽  
Vol 39 ◽  
pp. 190-191
Author(s):  
J. Taftø ◽  
O. L. Krivanek
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Bragg Reflection ◽  
Incident Beam ◽  
Orientation Dependence ◽  
Planar Case ◽  
X Ray ◽  
Crystal Unit Cell ◽  
Electron Energy Loss ◽  
Electron Energy Loss Spectra

Bragg reflection of electrons gives rise to a modulation of the wavefield over the crystal unit cell. Depending on the incident beam direction the electrons may be concentrated at one or another type of atoms or between them. Localized ionization processes will therefore show an orientation dependence, and this will affect the X-ray emission intensities as well as electron energy loss spectra. The energy loss case gives more possibilities for experimental arrangements than the X-ray emission case, in that the direction of not only the incident electron beam, but also that of the exit beam to be analyzed may be selected.Natural MgAl2O4 spinel was studied. The crystals were ground in a mortar and thin areas were analyzed with a Gatan 607 spectrometer attached to a Philips 400T electron microscope operating at lOOkV. The experiments were done for the (400)-planar case where the main atomic planes contain Al2O4. The Mg-atoms are midway between the A12O4 and may be considered as interstitials in this planar case.

Element analysis with the imaging electron energy loss spectrometer of the zeiss EM 902

1986 ◽  
Vol 44 ◽  
pp. 600-601
Author(s):  
J. Bihr ◽  
A. Rilk ◽  
W.I. Miller
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Spectroscopic Imaging ◽  
Element Analysis ◽  
X Ray ◽  
Electron Energy Loss Spectrometer ◽  
Elemental Maps ◽  
Electron Energy Loss ◽  
Electron Energy Loss Spectra ◽  
Loss Range

An imaging electron energy loss spectrometer can be used to produce elemental maps with highest spatial resolution by Electron Spectroscopic Imaging (ESI). Simultaneously, electron energy loss spectra (EELS) can also be recorded. It is therefore simple to combine morphological examinations with the analytical method of electron energy loss spetroscopy (Figs. 2, 3)The electron energy loss spectrometer of the EM 902, used in combination with a suitable electron detector (Fig. 1), provides the possibility of recording electron energy loss spectra over an energy loss range from 0 to 2000 eV. In this way, all elements of the periodic system can be detected via their K, L, M, N or O absorption edges (Fig. 5). Unlike X-ray microanalysis, this technique is especially suitable for detecting light and medium-heavy elements which are of special significance in biological and medical research.

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