Electron microscopy and in situ testing of mechanical deformation of carbon nanotubes

Visualization of thermal conduction in carbon nanotubes by in-situ transmission electron microscopy

10.22443/rms.emc2020.947 ◽

2021 ◽

Author(s):

Kaori Hirahara ◽

Keyword(s):

Electron Microscopy ◽

Carbon Nanotubes ◽

Thermal Conduction ◽

Growth Termination and Multiple Nucleation of Single-Wall Carbon Nanotubes Evidenced by in Situ Transmission Electron Microscopy

ACS Nano ◽

10.1021/acsnano.6b05941 ◽

2017 ◽

Vol 11 (5) ◽

pp. 4483-4493 ◽

Cited By ~ 24

Author(s):

Lili Zhang ◽

Maoshuai He ◽

Thomas W. Hansen ◽

Jens Kling ◽

Hua Jiang ◽

...

Keyword(s):

Electron Microscopy ◽

Carbon Nanotubes ◽

Single Wall Carbon Nanotubes ◽

Single Wall Carbon ◽

Growth and Termination Dynamics of Multiwalled Carbon Nanotubes at Near Ambient Pressure: An in Situ Transmission Electron Microscopy Study

Nano Letters ◽

10.1021/acs.nanolett.9b01888 ◽

2019 ◽

Vol 19 (8) ◽

pp. 5380-5387 ◽

Cited By ~ 10

Author(s):

Xing Huang ◽

Ramzi Farra ◽

Robert Schlögl ◽

Marc-Georg Willinger

Keyword(s):

Electron Microscopy ◽

Carbon Nanotubes ◽

Ambient Pressure ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Multiwalled Carbon ◽

Dynamic measurement of electrical conductivity of carbon nanotubes during mechanical deformation by nanoprobe manipulation in transmission electron microscopy

Applied Physics Letters ◽

10.1063/1.1784536 ◽

2004 ◽

Vol 85 (7) ◽

pp. 1250-1252 ◽

Cited By ~ 28

Author(s):

Toru Kuzumaki ◽

Yoshitaka Mitsuda

Keyword(s):

Electron Microscopy ◽

Carbon Nanotubes ◽

Electrical Conductivity ◽

Mechanical Deformation ◽

Dynamic Measurement ◽

Electron Microscopy of Nanodevices: In Situ and Ex Situ Characterization of Structure and Transport Properties of Carbon Nanotubes

Microscopy and Microanalysis ◽

10.1017/s1431927608082445 ◽

2008 ◽

Vol 14 (S2) ◽

pp. 188-189

Author(s):

JM Zuo ◽

T Kim ◽

Q Chen ◽

LM Peng ◽

EA Olson

Keyword(s):

Electron Microscopy ◽

Carbon Nanotubes ◽

New Mexico ◽

Transport Properties ◽

Ex Situ

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

In situ observation of the initial growth process of carbon nanotubes by time-resolved high resolution transmission electron microscopy

Journal of Microscopy ◽

10.1046/j.1365-2818.2001.00902.x ◽

2001 ◽

Vol 203 (1) ◽

pp. 40-46 ◽

Cited By ~ 34

Author(s):

H. Watanabe ◽

Y. Hisada ◽

S. Mukainakano ◽

N. Tanaka

Keyword(s):

Electron Microscopy ◽

Carbon Nanotubes ◽

High Resolution ◽

Growth Process ◽

In Situ Observation ◽

Initial Growth ◽

Time Resolved ◽

In Situ Transmission Electron Microscopy Observation of Electrochemical Sodiation of Individual Co9S8-Filled Carbon Nanotubes

ACS Nano ◽

10.1021/nn500194q ◽

2014 ◽

Vol 8 (4) ◽

pp. 3620-3627 ◽

Cited By ~ 60

Author(s):

Qingmei Su ◽

Gaohui Du ◽

Jun Zhang ◽

Yijun Zhong ◽

Bingshe Xu ◽

...

Keyword(s):

Electron Microscopy ◽

Carbon Nanotubes ◽

Transmission Electron Microscopy Observation ◽

Microscopy Observation ◽

Electron Microscopy Observation ◽

In situ transmission electron microscopy observations of individually selected freestanding carbon nanotubes during field emission

Ultramicroscopy ◽

10.1016/j.ultramic.2006.04.003 ◽

2006 ◽

Vol 106 (10) ◽

pp. 902-908 ◽

Cited By ~ 7

Author(s):

Monja Kaiser ◽

Maya Doytcheva ◽

Marcel Verheijen ◽

Niels de Jonge

Keyword(s):

Electron Microscopy ◽

Carbon Nanotubes ◽

Field Emission ◽

Amorphization and Directional Crystallization of Metals Confined in Carbon Nanotubes Investigated by in Situ Transmission Electron Microscopy

Nano Letters ◽

10.1021/acs.nanolett.5b00664 ◽

2015 ◽

Vol 15 (8) ◽

pp. 4922-4927 ◽

Cited By ~ 8

Author(s):

Dai-Ming Tang ◽

Cui-Lan Ren ◽

Ruitao Lv ◽

Wan-Jing Yu ◽

Peng-Xiang Hou ◽

...

Keyword(s):

Electron Microscopy ◽

Carbon Nanotubes ◽

Directional Crystallization ◽

Application of multiwall carbon nanotubes to conductive manipulation-probe tips for in-situ transmission electron microscopy of nanometer-sized material: electrical measurement of a silicon nanoparticle

Materials Research Express ◽

10.1088/2053-1591/aae81f ◽

2018 ◽

Vol 6 (1) ◽

pp. 015038

Author(s):

Koji Asaka ◽

Tomohiro Terada ◽

Yahachi Saito

Keyword(s):

Electron Microscopy ◽

Carbon Nanotubes ◽

Multiwall Carbon Nanotubes ◽

Electrical Measurement ◽

Silicon Nanoparticle ◽

Transmission Electron ◽

Multiwall Carbon