Nature of domains in lanthanum calcium cobaltite perovskite revealed by atomic resolution Z-contrast and electron energy loss spectroscopy

2006 ◽  
Vol 133 (1-3) ◽  
pp. 30-36 ◽  
Author(s):  
U. Bangert ◽  
U. Falke ◽  
A. Weidenkaff
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Atomic Resolution ◽  
Z Contrast ◽  
Electron Energy Loss

Atomic resolution characterisation of interface structures by Electron Energy Loss Spectroscopy

1993 ◽  
Vol 51 ◽  
pp. 576-577
Author(s):  
N. D. Browning ◽  
M. M. McGibbon ◽  
M. F. Chisholm ◽  
S. J. Pennycook
Keyword(s):  
High Resolution ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Imaging Technique ◽  
Atomic Scale ◽  
Atomic Resolution ◽  
Reference Image ◽  
The Impact ◽  
Electron Energy Loss

The recent development of the Z-contrast imaging technique for the VG HB501 UX dedicated STEM, has added a high-resolution imaging facility to a microscope used mainly for microanalysis. This imaging technique not only provides a high-resolution reference image, but as it can be performed simultaneously with electron energy loss spectroscopy (EELS), can be used to position the electron probe at the atomic scale. The spatial resolution of both the image and the energy loss spectrum can be identical, and in principle limited only by the 2.2 Å probe size of the microscope. There now exists, therefore, the possibility to perform chemical analysis of materials on the scale of single atomic columns or planes.In order to achieve atomic resolution energy loss spectroscopy, the range over which a fast electron can cause a particular excitation event, must be less than the interatomic spacing. This range is described classically by the impact parameter, b, which ranges from ~10 Å for the low loss region of the spectrum to <1Å for the core losses.

scholarly journals Data Processing for Atomic Resolution Electron Energy Loss Spectroscopy

2012 ◽  
Vol 18 (4) ◽  
pp. 667-675 ◽  
Author(s):  
Paul Cueva ◽  
Robert Hovden ◽  
Julia A. Mundy ◽  
Huolin L. Xin ◽  
David A. Muller
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Principal Component ◽  
Power Laws ◽  
Atomic Resolution ◽  
Background Error ◽  
Background Estimation ◽  
Electron Microscopes ◽  
Electron Energy Loss

AbstractThe high beam current and subangstrom resolution of aberration-corrected scanning transmission electron microscopes has enabled electron energy loss spectroscopy (EELS) mapping with atomic resolution. These spectral maps are often dose limited and spatially oversampled, leading to low counts/channel and are thus highly sensitive to errors in background estimation. However, by taking advantage of redundancy in the dataset map, one can improve background estimation and increase chemical sensitivity. We consider two such approaches—linear combination of power laws and local background averaging—that reduce background error and improve signal extraction. Principal component analysis (PCA) can also be used to analyze spectrum images, but the poor peak-to-background ratio in EELS can lead to serious artifacts if raw EELS data are PCA filtered. We identify common artifacts and discuss alternative approaches. These algorithms are implemented within the Cornell Spectrum Imager, an open source software package for spectroscopic analysis.

scholarly journals Image Formation Based on Atomic Resolution Core-loss Electron Energy Loss Spectroscopy

2006 ◽  
Vol 12 (S02) ◽  
pp. 1138-1139
Author(s):  
MP Oxley ◽  
K van Benthem ◽  
M Varela ◽  
SD Findlay ◽  
LJ Allen ◽  
...  
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Core Loss ◽  
Image Formation ◽  
Atomic Resolution ◽  
Electron Energy Loss

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Locating La atoms in epitaxial Bi3.25La0.75Ti3O12 films through atomic resolution electron energy loss spectroscopy mapping

2009 ◽  
Vol 95 (19) ◽  
pp. 192902 ◽  
Author(s):  
L. Gunawan ◽  
S. Lazar ◽  
O. Gautreau ◽  
C. Harnagea ◽  
A. Pignolet ◽  
...  
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Atomic Resolution ◽  
Resolution Electron ◽  
Electron Energy Loss

scholarly journals Atomic Scale Structure and Chemistry of Interfaces by Z-Contrast Imaging and Electron Energy Loss Spectroscopy in the Stem

1993 ◽  
Vol 319 ◽  
Author(s):  
M.M. Mcgibbon ◽  
N.D. Browning ◽  
M.F. Chisholm ◽  
S.J. Pennycook ◽  
V. Ravikumar ◽  
...  
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Structural Information ◽  
Atomic Scale ◽  
Boundary Structure ◽  
Structure Property ◽  
Contrast Imaging ◽  
Z Contrast ◽  
Electron Energy Loss

AbstractThe macroscopic properties of many materials are controlled by the structure and chemistry at grain boundaries. A basic understanding of the structure-property relationship requires a technique which probes both composition and chemical bonding on an atomic scale. The high-resolution Z-contrast imaging technique in the scanning transmission electron microscope (STEM) forms an incoherent image in which changes in atomic structure and composition can be interpreted intuitively. This direct image allows the electron probe to be positioned over individual atomic columns for parallel detection electron energy loss spectroscopy (EELS) at a spatial resolution approaching 0.22nm. In this paper we have combined the structural information available in the Z-contrast images with the bonding information obtained from the fine structure within the EELS edges to determine the grain boundary structure in a SrTiO3 bicrystal.

scholarly journals Atomic Scale Structure and Chemistry of Interfaces by Z-Contrast Imaging and Electron Energy Loss Spectroscopy in the Stem

1994 ◽  
Vol 341 ◽  
Author(s):  
M. M. McGibbon ◽  
N. D. Browning ◽  
M. F. Chisholm ◽  
A. J. McGibbon ◽  
S. J. Pennycook ◽  
...  
Keyword(s):  
High Resolution ◽  
Energy Loss ◽  
Electron Energy ◽  
Atomic Structure ◽  
Electron Energy Loss Spectroscopy ◽  
Atomic Scale ◽  
Chemical Information ◽  
Contrast Imaging ◽  
Z Contrast ◽  
Electron Energy Loss

AbstractThe macroscopic properties of many materials are controlled by the structure and chemistry at grain boundaries. A basic understanding of the structure-property relationship requires a technique which probes both composition and chemical bonding on an atomic scale. High-resolution Z-contrast imaging in the scanning transmission electron microscope (STEM) forms an incoherent image in which changes in atomic structure and composition across an interface can be interpreted directly without the need for preconceived atomic structure models (1). Since the Z-contrast image is formed by electrons scattered through high angles, parallel detection electron energy loss spectroscopy (PEELS) can be used simultaneously to provide complementary chemical information on an atomic scale (2). The fine structure in the PEEL spectra can be used to investigate the local electronic structure and the nature of the bonding across the interface (3). In this paper we use the complimentary techniques of high resolution Zcontrast imaging and PEELS to investigate the atomic structure and chemistry of a 25° symmetric tilt boundary in a bicrystal of the electroceramic SrTiO3.

Visualization of hybridization states with atomic resolution using electron energy loss spectroscopy mapping

2012 ◽  
Vol 100 (16) ◽  
pp. 163107 ◽  
Author(s):  
M. Haruta ◽  
K. Kurashima ◽  
T. Nagai ◽  
H. Komatsu ◽  
Y. Shimakawa ◽  
...  
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Atomic Resolution ◽  
Electron Energy Loss
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