Characterization of oxygen-deficient SrCoO3−δ by electron energy-loss spectroscopy and Z-contrast imaging

2000 ◽  
Vol 130 (1-2) ◽  
pp. 71-80 ◽  
Author(s):  
S Stemmer
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Contrast Imaging ◽  
Z Contrast ◽  
Electron Energy Loss

Characterization of Ultra-Thin Hf-based Alternative Dielectric Layers for Si CMOS by Z-contrast Imaging and Electron Energy-Loss Spectroscopy in STEM

2004 ◽  
Vol 10 (S02) ◽  
pp. 322-323
Author(s):  
Melody P Agustin ◽  
Brendan Foran ◽  
Gennadi Bersuker ◽  
Joel Barnett ◽  
Susanne Stemmer
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Contrast Imaging ◽  
Dielectric Layers ◽  
Z Contrast ◽  
Electron Energy Loss

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

scholarly journals Atomic Scale Structure and Chemistry of Interfaces by Z-Contrast Imaging and Electron Energy Loss Spectroscopy in the Stem

1993 ◽  
Vol 319 ◽  
Author(s):  
M.M. Mcgibbon ◽  
N.D. Browning ◽  
M.F. Chisholm ◽  
S.J. Pennycook ◽  
V. Ravikumar ◽  
...  
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Structural Information ◽  
Atomic Scale ◽  
Boundary Structure ◽  
Structure Property ◽  
Contrast Imaging ◽  
Z Contrast ◽  
Electron Energy Loss

AbstractThe macroscopic properties of many materials are controlled by the structure and chemistry at grain boundaries. A basic understanding of the structure-property relationship requires a technique which probes both composition and chemical bonding on an atomic scale. The high-resolution Z-contrast imaging technique in the scanning transmission electron microscope (STEM) forms an incoherent image in which changes in atomic structure and composition can be interpreted intuitively. This direct image allows the electron probe to be positioned over individual atomic columns for parallel detection electron energy loss spectroscopy (EELS) at a spatial resolution approaching 0.22nm. In this paper we have combined the structural information available in the Z-contrast images with the bonding information obtained from the fine structure within the EELS edges to determine the grain boundary structure in a SrTiO3 bicrystal.

scholarly journals Atomic Scale Structure and Chemistry of Interfaces by Z-Contrast Imaging and Electron Energy Loss Spectroscopy in the Stem

1994 ◽  
Vol 341 ◽  
Author(s):  
M. M. McGibbon ◽  
N. D. Browning ◽  
M. F. Chisholm ◽  
A. J. McGibbon ◽  
S. J. Pennycook ◽  
...  
Keyword(s):  
High Resolution ◽  
Energy Loss ◽  
Electron Energy ◽  
Atomic Structure ◽  
Electron Energy Loss Spectroscopy ◽  
Atomic Scale ◽  
Chemical Information ◽  
Contrast Imaging ◽  
Z Contrast ◽  
Electron Energy Loss

AbstractThe macroscopic properties of many materials are controlled by the structure and chemistry at grain boundaries. A basic understanding of the structure-property relationship requires a technique which probes both composition and chemical bonding on an atomic scale. High-resolution Z-contrast imaging in the scanning transmission electron microscope (STEM) forms an incoherent image in which changes in atomic structure and composition across an interface can be interpreted directly without the need for preconceived atomic structure models (1). Since the Z-contrast image is formed by electrons scattered through high angles, parallel detection electron energy loss spectroscopy (PEELS) can be used simultaneously to provide complementary chemical information on an atomic scale (2). The fine structure in the PEEL spectra can be used to investigate the local electronic structure and the nature of the bonding across the interface (3). In this paper we use the complimentary techniques of high resolution Zcontrast imaging and PEELS to investigate the atomic structure and chemistry of a 25° symmetric tilt boundary in a bicrystal of the electroceramic SrTiO3.

scholarly journals STEM Z-contrast and Electron Energy Loss Spectroscopy Characterization of Co-doped TiO2 Thin Films

2006 ◽  
Vol 12 (S02) ◽  
pp. 974-975
Author(s):  
L Fu ◽  
ND Browning ◽  
S Zhang ◽  
DC Kundaliya ◽  
SB Ogale ◽  
...  
Keyword(s):  
Thin Films ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Tio2 Thin Films ◽  
Doped Tio2 ◽  
Z Contrast ◽  
Electron Energy Loss ◽  
Co Doped

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

scholarly journals Study of Chromium-Doped Diamond-Like Carbon by Z-Contrast Imaging and Electron Energy Loss Spectroscopy

1999 ◽  
Vol 593 ◽  
Author(s):  
X. Fan ◽  
E. C. Dickey ◽  
S. J. Pennycook
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Metal Cluster ◽  
Carbon Films ◽  
Diamond Like Carbon ◽  
Contrast Imaging ◽  
White Line ◽  
Z Contrast ◽  
Electron Energy Loss

ABSTRACTMetal-doped diamond-like carbon films were produced for the purpose of an electrochemical nano-electrode. In this study we use Z-contrast scanning transmission electron microscopy to directly observe metal cluster formation and distributions within the chromium-doped carbon films. At low doping (∼6at%Cr), Cr is uniformly distributed; at high doping (∼12at%Cr), Cr-rich clusters are formed. Using electron energy loss spectroscopy, we find that the Cr clusters tend to be metallic-like at low doping levels and carbide-like at high doping levels according to the Cr L2.3 white line ratios. The carbon is more diamond-like at low doping and more graphite/carbide like at high doping according to the sp2/sp3 electron percentage measurements.

Investigating Ca Segregated to a Grain Boundaries in MgO Using Multiple Scattering Analysis of Electron Energy Loss Spectra

1998 ◽  
Vol 4 (S2) ◽  
pp. 776-777
Author(s):  
J. P. Buban ◽  
J. Zaborac ◽  
H. Moltaji ◽  
G. Duscher ◽  
N. D. Browning
Keyword(s):  
Energy Loss ◽  
Grain Boundaries ◽  
Electron Energy ◽  
Structural Model ◽  
Boundary Structure ◽  
Structure Property ◽  
Contrast Imaging ◽  
Scale Properties ◽  
Z Contrast ◽  
Electron Energy Loss

Although grain boundaries typically account for only a small fraction of a material, they can have far reaching effects on the overall bulk scale properties. These effects are usually simply linked to the boundary having a different atomic arrangement to the bulk. A necessary first step in understanding the structure-property relationships is therefore a detailed determination of the boundary structure.One means of obtaining detailed information on the structure of grain boundaries is through correlated Z-contrast imaging and electron energy loss spectroscopy (EELS). The Z-contrast image generates a map of the grain boundary which can be used to position the probe in defined locations for spectroscopy. In the case of oxides, a structural model of the metal atom positions can be determined directly from the image. Furthermore, using a simple bond-valence sum minimization routine, the oxygen atoms can be placed so that the structure contains atoms that have valences consistent with their expected formal valence state.

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