Characterization of reduced pressure chemical vapor deposited Si0.8Ge0.2/Si multi-layers
2013 ◽
Vol 16
(1)
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pp. 126-130
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1996 ◽
Vol 51-52
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pp. 179-186
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Keyword(s):
2005 ◽
Vol 245-246
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pp. 39-50
Keyword(s):
1979 ◽
Vol 22
(12)
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pp. 1017-1024
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Keyword(s):
Keyword(s):