Kinetics of light-induced degradation in compensated boron-doped silicon investigated using photoluminescence and numerical simulation

2015 ◽  
Vol 33 ◽  
pp. 49-57
Author(s):  
K. Fraser ◽  
D. Blanc-Pelissier ◽  
S. Dubois ◽  
J. Veirman ◽  
M. Lemiti
Author(s):  
J. V. Maskowitz ◽  
W. E. Rhoden ◽  
D. R. Kitchen ◽  
R. E. Omlor ◽  
P. F. Lloyd

The fabrication of the aluminum bridge test vehicle for use in the crystallographic studies of electromigration involves several photolithographic processes, some common, while others quite unique. It is most important to start with a clean wafer of known orientation. The wafers used are 7 mil thick boron doped silicon. The diameter of the wafer is 1.5 inches with a resistivity of 10-20 ohm-cm. The crystallographic orientation is (111).Initial attempts were made to both drill and laser holes in the silicon wafers then back fill with photoresist or mounting wax. A diamond tipped dentist burr was used to successfully drill holes in the wafer. This proved unacceptable in that the perimeter of the hole was cracked and chipped. Additionally, the minimum size hole realizable was > 300 μm. The drilled holes could not be arrayed on the wafer to any extent because the wafer would not stand up to the stress of multiple drilling.


2010 ◽  
Vol 484 (4-6) ◽  
pp. 258-260 ◽  
Author(s):  
D.D.D. Ma ◽  
K.S. Chan ◽  
D.M. Chen ◽  
S.T. Lee

Solar RRL ◽  
2021 ◽  
Author(s):  
Bruno Vicari Stefani ◽  
Moonyong Kim ◽  
Matthew Wright ◽  
Anastasia Soeriyadi ◽  
Dmitriy Andronikov ◽  
...  

2005 ◽  
Vol 45 (4) ◽  
pp. 500-505 ◽  
Author(s):  
Junya KANO ◽  
Eiki KASAI ◽  
Fumio SAITO ◽  
Takazo KAWAGUCHI

1993 ◽  
Vol 11 (4) ◽  
pp. 655-661 ◽  
Author(s):  
A.M. Boichenko ◽  
A.V. Karelin ◽  
O.V. Sereda ◽  
S.I. Yakovlenko

Numerical simulation of active media nuclear-pumped lasers on noble gases and their mixtures with metal vapors are presented. Prospects of creation of high-power short-wavelength nuclear-pumped excimer lasers are discussed.


2001 ◽  
Vol 89 (10) ◽  
pp. 5788-5790 ◽  
Author(s):  
I. Yonenaga ◽  
T. Taishi ◽  
X. Huang ◽  
K. Hoshikawa

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