A high spatial resolution event counting neutron detector using microchannel plates and cross delay line readout

Author(s):  
Oswald H.W. Siegmund ◽  
John V. Vallerga ◽  
Adrian Martin ◽  
Bruce Feller ◽  
Muhammad Arif ◽  
...  
2021 ◽  
Author(s):  
Jianjin Zhou ◽  
Jianrong Zhou ◽  
Xiaojuan Zhou ◽  
Lin Zhu ◽  
Jianqing Yang ◽  
...  

Abstract In recent years, Gas Electron Multiplier (GEM) neutron detector has been developing towards high spatial resolution and high dynamic counting range. A novel concept of the Al stopping layer was proposed to enable the detector to achieve sub-millimeter (sub-mm) spatial resolution. The neutron conversion layer was coated with the Al stopping layer to limit the emission angle of ions into the drift region. The short track projection of ions was obtained on the signal readout board, and the detector would get good spatial resolution. The spatial resolutions of the GEM neutron detector with Al stopping layer were simulated and optimized based on Geant4GarfieldInterface. When Al stopping layer was 3.0 μm thick, drift region was 2 mm thick, strip pitch was 600 μm, and digital readout was employed. The spatial resolution of the detector was 0.76 mm, and the thermal neutron detection efficiency was about 0.01%. Thus, the GEM neutron detector with a simple detector structure and a fast readout mode was developed to obtain a high spatial resolution and high dynamic counting range. It could be used for the direct measurement of a high-flux neutron beam, such as Bragg transmission imaging, very small-angle scattering neutron detection and neutron beam diagnostic.


2017 ◽  
Author(s):  
Naotaka Naganawa ◽  
Shogo Awano ◽  
Masahiro Hino ◽  
Masanori Hirose ◽  
Katsuya Hirota ◽  
...  

1973 ◽  
Vol 20 (1) ◽  
pp. 160-165 ◽  
Author(s):  
F. R. Swanson ◽  
F. J. Kuehne ◽  
A. J. Favale

2019 ◽  
Vol 32 (12) ◽  
pp. 125009 ◽  
Author(s):  
Yuki Iizawa ◽  
Hiroaki Shishido ◽  
Kazuma Nishimura ◽  
The Dang Vu ◽  
Kenji M Kojima ◽  
...  

2011 ◽  
Vol 1321 ◽  
Author(s):  
N. Wyrsch ◽  
A. Franco ◽  
Y. Riesen ◽  
M. Despeisse ◽  
S. Dunand ◽  
...  

ABSTRACTRadiation hard monolithic particle sensors can be fabricated by a vertical integration of amorphous silicon particle sensors on top of CMOS readout chip. Two types of such particle sensors are presented here using either thick diodes or microchannel plates. The first type based on amorphous silicon diodes exhibits high spatial resolution due to the short lateral carrier collection. Combination of an amorphous silicon thick diode with microstrip detector geometries permits to achieve micrometer spatial resolution beneficial for high accuracy beam positioning. Microchannel plates based on amorphous silicon were successfully fabricated and multiplication of electrons was observed. This material may solve some of the problems related to conventional microchannel devices. Issues, potential and limits of these detectors are presented and discussed.


Author(s):  
K. Przybylski ◽  
A. J. Garratt-Reed ◽  
G. J. Yurek

The addition of so-called “reactive” elements such as yttrium to alloys is known to enhance the protective nature of Cr2O3 or Al2O3 scales. However, the mechanism by which this enhancement is achieved remains unclear. An A.E.M. study has been performed of scales grown at 1000°C for 25 hr. in pure O2 on Co-45%Cr implanted at 70 keV with 2x1016 atoms/cm2 of yttrium. In the unoxidized alloys it was calculated that the maximum concentration of Y was 13.9 wt% at a depth of about 17 nm. SIMS results showed that in the scale the yttrium remained near the outer surface.


Author(s):  
E. G. Rightor

Core edge spectroscopy methods are versatile tools for investigating a wide variety of materials. They can be used to probe the electronic states of materials in bulk solids, on surfaces, or in the gas phase. This family of methods involves promoting an inner shell (core) electron to an excited state and recording either the primary excitation or secondary decay of the excited state. The techniques are complimentary and have different strengths and limitations for studying challenging aspects of materials. The need to identify components in polymers or polymer blends at high spatial resolution has driven development, application, and integration of results from several of these methods.


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