scholarly journals High spatial resolution detection of low-energy electrons using an event-counting method, application to point projection microscopy

2018 ◽  
Vol 89 (4) ◽  
pp. 043301 ◽  
Author(s):  
Evelyne Salançon ◽  
Alain Degiovanni ◽  
Laurent Lapena ◽  
Roger Morin
Keyword(s):  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Low Energy ◽  
Counting Method ◽  
Low Energy Electrons ◽  
Point Projection ◽  
Event Counting

High-Spatial-Resolution Low-Energy Electron Beam X-Ray Microanalysis

2000 ◽  
Vol 132 (2-4) ◽  
pp. 113-128 ◽  
Author(s):  
Ian Barkshire ◽  
Peter Karduck ◽  
Werner P. Rehbach ◽  
Silvia Richter
Keyword(s):  
Electron Beam ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Low Energy ◽  
Energy Electron ◽  
X Ray ◽  
Low Energy Electron

High-spatial-resolution secondary and Auger imaging in a STEM

1989 ◽  
Vol 47 ◽  
pp. 208-209 ◽  
Author(s):  
J.S. Drucker ◽  
M. Krishnamurthy ◽  
G.G. Hembree ◽  
Luo Chuan Hong ◽  
J.A. Venables
Keyword(s):  
Spatial Resolution ◽  
Electron Spectroscopy ◽  
Focal Length ◽  
Surface Preparation ◽  
Low Energy ◽  
Objective Lens ◽  
Thin Sample ◽  
Electron Collection ◽  
Low Energy Electrons ◽  
Analysis System

Secondary electrons form the main signal in a standard SEM, and machines incorporating Auger electron spectroscopy and imaging have become widely commercialized. However, these approaches to low energy (0-2000eV) electron spectroscopy and imaging do not work at the highest spatial resolution, since there are geometrical and electromagnetic conflicts as the focal length of the probe forming lens is reduced. As discussed elsewhere in more detail, the solution is to make the magnetic probe forming lens of the SEM/STEM also function as the first stage of the electron collection and analysis system.A new lOOkV field emission STEM has been constructed for the NSF HREM facility, which incorporates provision for using these low energy electrons from both sides of a thin sample. The outline design has been described previously. The microscope, codenamed MIDAS, is of UHV construction throughout with ∽10−10 mbar at the sample position, and extensive surface preparation facilities. The region of the column concerned with secondary and Auger electrons is shown diagrammatically, but to scale, in fig. 1. This region consists of the objective lens, O, bounded by analyser chambers AC1 and AC2, onto which the electron detectors are mounted.

Development of Low Energy Cathodoluminescence System and its Application to the Study of ZnO Powders

1999 ◽  
Vol 588 ◽  
Author(s):  
Takashi Sekiguchi
Keyword(s):  
Electron Beam ◽  
Spatial Resolution ◽  
Beam Energy ◽  
High Spatial Resolution ◽  
Low Energy ◽  
Ultraviolet Emission ◽  
Visible Luminescence ◽  
Probe Size ◽  
Zno Powders ◽  
Better Than

AbstractWe have developed a cathodoluminescence (CL) system with high spatial resolution using a thermal-field emission gun operating with low electron beam energies. Since the electron range is proportional to the 1.7th power of the electron beam energy, operation with a low energy electron beam strongly reduces the probe size of CL. Luminescence property of ZnO tetrapods was studied with this system. High spatial resolution better than 100 nm was achieved when it was operated with a beam energy less than 3 keV. The variation of CL spectra along one leg of tetrapod was recorded. The ratio of the ultraviolet emission to the visible luminescence at the center of tetrapod was different from those of the points along the arm, suggesting that the center of tetrapod is much defective compared with the arms. We also observed a decrease of CL intensity during observation. Possible degradation mechanisms were discussed.

scholarly journals MPGD2015: Low-energy electron source to characterize Micromegas/InGrid and study of dE/dx for low energy electrons

2018 ◽  
Vol 174 ◽  
pp. 02011
Author(s):  
David Attie ◽  
Sergey Barsuk ◽  
Oleg Bezshyyko ◽  
Leonid Burmistrov ◽  
Andrii Chaus ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
Particle Tracking ◽  
Low Energy ◽  
Energy Electron ◽  
English Abstract ◽  
Simulation Studies ◽  
Wide Range ◽  
Low Energy Electrons ◽  
Detailed Simulation ◽  
Low Energy Electron

Insert your english abstract here.A new versatile facility LEETECH for detector R&D, tests and calibration is designed and constructed. It uses electrons produced by the photoinjector PHIL at LAL, Orsay and provides a powerful tool for wide range R&D studies of different detector concepts delivering “monochromatic” samples of low energy electrons with adjustable energy and intensity. Among other innovative instrumentation techniques, LEETECH will be used for testing various gaseous tracking detectors and studying new Micromegas/InGrid concept which has very promising characteristics of spatial resolution and can be a good candidate for particle tracking and identification. In this paper the importance and expected characteristics of such facility based on detailed simulation studies are addressed.

Transfer optics for high spatial resolution electron spectroscopy

1988 ◽  
Vol 46 ◽  
pp. 666-667
Author(s):  
G. G. Hembree ◽  
Luo Chuan Hong ◽  
P.A. Bennett ◽  
J.A. Venables
Keyword(s):  
Magnetic Field ◽  
Scanning Transmission Electron Microscope ◽  
Low Energy ◽  
Objective Lens ◽  
State University ◽  
Arizona State University ◽  
Initial Field ◽  
Resolution Electron ◽  
Scanning Transmission ◽  
Low Energy Electrons

A new field emission scanning transmission electron microscope has been constructed for the NSF HREM facility at Arizona State University. The microscope is to be used for studies of surfaces, and incorporates several surface-related features, including provision for analysis of secondary and Auger electrons; these electrons are collected through the objective lens from either side of the sample, using the parallelizing action of the magnetic field. This collimates all the low energy electrons, which spiral in the high magnetic field. Given an initial field Bi∼1T, and a final (parallelizing) field Bf∼0.01T, all electrons emerge into a cone of semi-angle θf≤6°. The main practical problem in the way of using this well collimated beam of low energy (0-2keV) electrons is that it is travelling along the path of the (100keV) probing electron beam. To collect and analyze them, they must be deflected off the beam path with minimal effect on the probe position.

High spatial resolution AEM observations of yttrium segregation in chromia scales grown on Co-45%Cr

1986 ◽  
Vol 44 ◽  
pp. 518-519
Author(s):  
K. Przybylski ◽  
A. J. Garratt-Reed ◽  
G. J. Yurek
Keyword(s):  
Spatial Resolution ◽  
Outer Surface ◽  
Maximum Concentration ◽  
High Spatial Resolution ◽  
Reactive Elements ◽  
Chromia Scales

The addition of so-called “reactive” elements such as yttrium to alloys is known to enhance the protective nature of Cr2O3 or Al2O3 scales. However, the mechanism by which this enhancement is achieved remains unclear. An A.E.M. study has been performed of scales grown at 1000°C for 25 hr. in pure O2 on Co-45%Cr implanted at 70 keV with 2x1016 atoms/cm2 of yttrium. In the unoxidized alloys it was calculated that the maximum concentration of Y was 13.9 wt% at a depth of about 17 nm. SIMS results showed that in the scale the yttrium remained near the outer surface.

Integration of Core-Edge Spectroscopy Methods for the Study of Polymers

1996 ◽  
Vol 54 ◽  
pp. 154-155
Author(s):  
E. G. Rightor
Keyword(s):  
Excited State ◽  
Polymer Blends ◽  
Gas Phase ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Electronic States ◽  
Core Electron ◽  
Bulk Solids ◽  
Development Application

Core edge spectroscopy methods are versatile tools for investigating a wide variety of materials. They can be used to probe the electronic states of materials in bulk solids, on surfaces, or in the gas phase. This family of methods involves promoting an inner shell (core) electron to an excited state and recording either the primary excitation or secondary decay of the excited state. The techniques are complimentary and have different strengths and limitations for studying challenging aspects of materials. The need to identify components in polymers or polymer blends at high spatial resolution has driven development, application, and integration of results from several of these methods.

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