Characterization of the response and the intrinsic efficiency of a 4He scintillation detector to fast mono-energetic neutrons

Author(s):  
Quentin Ducasse ◽  
Basilio Esposito ◽  
Andreas Zimbal ◽  
Marco Riva ◽  
Daniele Marocco ◽  
...  
2012 ◽  
Vol 102 ◽  
pp. S147-S148
Author(s):  
M. Carrara ◽  
M. Borroni ◽  
C. Cavatorta ◽  
A. Cerrotta ◽  
C. Fallai ◽  
...  

2017 ◽  
Vol 12 (12) ◽  
pp. C12001-C12001 ◽  
Author(s):  
M. Herzkamp ◽  
D. Durini ◽  
C. Degenhardt ◽  
A. Erven ◽  
H. Nöldgen ◽  
...  

2017 ◽  
Vol 34 ◽  
pp. 48-54 ◽  
Author(s):  
S. Russo ◽  
A. Mirandola ◽  
S. Molinelli ◽  
E. Mastella ◽  
A. Vai ◽  
...  

1996 ◽  
Vol 420 ◽  
Author(s):  
F. Zignani ◽  
R. Galloni ◽  
R. Rizzoli ◽  
M. Ruth ◽  
C. Summonte ◽  
...  

Abstracta-Si:H / c-Si heterojunction diodes were produced by PECVD with varying amorphous silicon layer thickness and hydrogen dilution of the gas phase. An accurate determination of the growth rate also in the initial stages of the deposition was made possible by an original chemical method based on the dissolution of the films followed by spectroscopical analysis of the obtained solution.The electrical characterization of the diodes confirms the generation - recombination - multitunneling nature of the transport. Although H2 dilution is important, however, beyond a certain level it is detrimental for the junction quality, probably due to the transition to a microcrystalline phase deposition. Solar cells were also produced, the best results being an open circuit voltage of 610 mV and an intrinsic efficiency of 14.2%.


1993 ◽  
Vol 37 ◽  
pp. 145-151
Author(s):  
N. Loxley ◽  
S. Cockerton ◽  
B. K. Tanner

AbstractWe show that a very low noise, high dynamic range scintillation detector has major advantages over conventional detectors for characterization of pseudomorphic HEMT structures by high resolution X-ray diffraction. We show that the reduced background enables a second modulation period to be detected, enabling the thickness and composition to be determined independently. Using a conventional X-ray generator and diffractometer we demonstrate that, in a single scan taking only 10 seconds, we are able to obtain sufficiently good data to provide quality assurance.


2016 ◽  
Vol 32 ◽  
pp. 199
Author(s):  
S. Russo ◽  
D. Boi ◽  
A. Mirandola ◽  
S. Molinelli ◽  
A. Mairani ◽  
...  

2016 ◽  
Vol 61 (8) ◽  
pp. 2972-2990 ◽  
Author(s):  
D Nichiporov ◽  
L Coutinho ◽  
A V Klyachko

1977 ◽  
Vol 147 (2) ◽  
pp. 353-360 ◽  
Author(s):  
J. David Carlson ◽  
Roger W. Finlay ◽  
David E. Bainum

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