Improved method to measure the electron drift velocity using the Frisch-grid ionization chamber

Author(s):  
Jie Liu ◽  
Haoyu Jiang ◽  
Zengqi Cui ◽  
Yiwei Hu ◽  
Jinxiang Chen ◽  
...  
2021 ◽  
Vol 168 ◽  
pp. 109496
Author(s):  
Qingmin Zhang ◽  
Haizheng Chen ◽  
Ruirui Fan ◽  
Han Yi ◽  
Keqing Gao ◽  
...  

1986 ◽  
Vol 29 (12) ◽  
pp. 1295-1296 ◽  
Author(s):  
Chian S. Chang ◽  
Harold R. Fetterman

1964 ◽  
Vol 36 (9) ◽  
pp. 1739-1744 ◽  
Author(s):  
V. N. Smith ◽  
J. F. Fidiam

Author(s):  
Д.Ю. Протасов ◽  
Д.В. Гуляев ◽  
А.К. Бакаров ◽  
А.И. Торопов ◽  
Е.В. Ерофеев ◽  
...  

AbstractField dependences of the electron-drift velocity in typical pseudomorphic high-electron-mobility transistor (pHEMT) heteroepitaxial structures (HESs) and in those with donor–acceptor doped (DApHEMT) heterostructures with quantum-well (QW) depth increased by 0.8–0.9 eV with the aid of acceptor layers have been studied by a pulsed technique. It is established that the saturated electron-drift velocity in DA-pHEMT-HESs is 1.2–1.3 times greater than that in the usual pHEMT-HESs. The electroluminescence (EL) spectra of DA-pHEMT-HESs do not contain emission bands related to the recombination in widebandgap layers (QW barriers). The EL intensity in these HESs is not saturated with increasing electric field. This is indicative of a suppressed real-space transfer of hot electrons from QW to barrier layers, which accounts for the observed increase in the saturated electron-drift velocity.


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