scholarly journals K-shell ionization cross sections of Cu, Zn and Ge by 3–5 MeV/u Si-ion bombardment

Author(s):  
Shashank Singh ◽  
Mumtaz Oswal ◽  
Sunil Kumar ◽  
K.P. Singh ◽  
D. Mitra ◽  
...  
1999 ◽  
Vol 5 (S2) ◽  
pp. 584-585
Author(s):  
X. Llovet ◽  
C. Merlet ◽  
J.M. Fernández-Varea ◽  
F. Salvat

Knowledge of inner-shell ionization cross sections by electron impact is needed for quantitative procedures in electron probe microanalysis (EPMA) and Auger electron spectroscopy (AES) The common practice is to use semi-empirical formulas, based on the asymptotic limit of the Bethe theory, which sometimes are used beyond their domain of validity. Experimental measurements of ionization cross sections are scarce and affected by considerable uncertainties, thus a mere comparison with experimental data does not permit to draw a definite conclusion abou the accuracy of the various formulas. In this communication, we present new measurements o the relative variation of K- and L-shell ionization cross sections deduced from the counting rate of characteristic x-rays emitted by extremely thin films of Cr, Ni, Cu, Te, Au and Bi bombardec by keV electrons.The studied films were produced by thermal evaporation on backing self-supported 30 nm carbon films.


2005 ◽  
Vol 37 (3) ◽  
pp. 361-369 ◽  
Author(s):  
M. A. Uddin ◽  
A. K.F. Haque ◽  
K. R. Karim ◽  
A. K. Basak ◽  
F. B. Malik

Author(s):  
Changhuan Tang ◽  
Zhengming Luo ◽  
Zhu An ◽  
Fuqing He ◽  
Xiufeng Peng ◽  
...  

2002 ◽  
Vol 12 (01n02) ◽  
pp. 1-5
Author(s):  
M. NEKAB ◽  
Ch. HEITZ

Thick targets consisting in Al/Si alloys were bombarded with 1.0 to 5.0 MeV Ar ions. The K X-ray production cross sections were deduced from the measured yields by using the Merzbacher-Lewis formula extended to heavy ion bombardment. The density dependence on the K X-ray production cross sections of Al and Si was observed. This phenomena can be interpreted within the molecular orbital double-scattering mechanism.


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