Structural and physical characterization study on synthesized tellurite (TeO2) and germanate (GeO2) glass shields using XRD, Raman spectroscopy, FLUKA and PHITS

2020 ◽  
Vol 110 ◽  
pp. 110533
Author(s):  
H.O. Tekin ◽  
L.R.P. Kassab ◽  
Shams A.M. Issa ◽  
Camila Dias da Silva Bordon ◽  
M.S. Al-Buriahi ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Physical Characterization ◽  
Characterization Study ◽  
Geo2 Glass

The Impact of Dummy Gate Processing on Si-Cap-Free SiGe Passivation: A Physical Characterization Study on Strained SiGe 25% and 45%

2017 ◽  
Vol 80 (2) ◽  
pp. 155-162 ◽  
Author(s):  
Kurt Wostyn ◽  
Lars-Åke Ragnarsson ◽  
Tom Schram ◽  
Liesbeth Witters ◽  
Thierry Conard ◽  
...  
Keyword(s):  
Physical Characterization ◽  
Characterization Study ◽  
Dummy Gate ◽  
The Impact ◽  
Strained Sige

Micro-Optical Characterization Study of Highly p-Type Doped SiC:Al Wafers

2005 ◽  
Vol 483-485 ◽  
pp. 393-396 ◽  
Author(s):  
Peter J. Wellmann ◽  
Ralf Müller ◽  
Michel Pons ◽  
Aurelie Thuaire ◽  
Alexandre Crisci ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Optical Transmission ◽  
Optical Characterization ◽  
Charge Carrier Concentration ◽  
Characterization Methods ◽  
Materials Properties ◽  
Characterization Study ◽  
P Type ◽  
Transmission And Reflection

We have studied the application of optical techniques for the determination of the spatial distribution of electronic properties of highly aluminum doped p-type SiC wafers. Absorption and birefringence mapping are known to be sensitive characterization methods to determine the homogeneity of charge carrier concentration and defects in n-type SiC. In the case of highly p-type doped SiC these methods fail due to the opaque character of the material. In this paper we show that Raman spectroscopy which is a reflective method can be used in order to address the same materials properties like absorption and birefringence. The study was performed using medium doped p-type SiC:Al where optical transmission and reflection methods can be applied simultaneously.

Synthesis, Crystal Structure, Raman Spectroscopy, and Physical Characterization of a New Cobalt Phospho-Silicide CoSi3P3

1996 ◽  
Vol 124 (2) ◽  
pp. 366-373 ◽  
Author(s):  
H. Vincent ◽  
J. Kreisel ◽  
Ch. Perrier ◽  
O. Chaix-Pluchery ◽  
P. Chaudouet ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Raman Spectroscopy ◽  
Physical Characterization

Raman spectroscopy and X-ray diffraction of lithium niobate at temperatures up to 1300○-4.80pt○C

2005 ◽  
Vol 126 ◽  
pp. 101-105 ◽  
Author(s):  
B. Moulin ◽  
L. Hennet ◽  
D. Thiaudière ◽  
P. Melin ◽  
P. Simon
Keyword(s):  
Raman Spectroscopy ◽  
Lithium Niobate ◽  
X Ray Diffraction ◽  
X Ray
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