Characterization of free volume and density gradients of polystyrene surfaces by low-energy positron lifetime measurements

Polymer ◽  
2004 ◽  
Vol 45 (13) ◽  
pp. 4533-4539 ◽  
Author(s):  
John Algers ◽  
Ryoichi Suzuki ◽  
Toshiyuki Ohdaira ◽  
Frans H.J. Maurer
2004 ◽  
Vol 37 (11) ◽  
pp. 4201-4210 ◽  
Author(s):  
John Algers ◽  
Ryoichi Suzuki ◽  
Toshiyuki Ohdaira ◽  
Frans H. J. Maurer

2019 ◽  
Vol 4 (3) ◽  
pp. 413-419 ◽  
Author(s):  
Aman Deep Acharya ◽  
Bhawna Sarwan ◽  
Ratnesh Sharma ◽  
S.B. Shrivastava ◽  
Manoj Kumar Rathore

2013 ◽  
Vol 22 ◽  
pp. 112-117 ◽  
Author(s):  
A. MANDAL ◽  
S. MUKHERJEE ◽  
S. PAN ◽  
A. SENGUPTA

Positron annihilation lifetime spectra (PLAS) have been measured for natural rubber polymer with different fillers (Titenium dioxide, Nanosilica and Nanoclay) as a function of filler concentration to investigate how these fillers affect the microstructure of free volume of natural rubber. The lifetime spectra is analyzed by using LT9.0 and the longest lived component(τo-Ps) is attributed to the pick- off annihilation of o-Ps in free volume sites, available mostly in the amorphous region of polymer. On the basis of the τo-Ps values the radii of the free volume holes (Rh) are calculated. The PALS results show that o-Ps lifetime as well as the size of free volume decreases with the increase of filler concentration.


1996 ◽  
Vol 442 ◽  
Author(s):  
J. Mahony ◽  
P. Mascher

AbstractPositron lifetime measurements on InAs wafers have shown that the positron bulk lifetime in InAs is 246±2 ps. Most samples exhibit a defect lifetime of 287±6 ps, which is attributable to monovacancy-impurity complexes with a concentration of 7±2×10 16 cm-3. Very heavily doped n-type samples exhibit a defect lifetime of 332–340 ps, characteristic of divacancies. The concentration of these defects is also close to 1017 cm−3. Both types of defects are stable for rapid thermal annealing up to 850 °C, and both defects are neutral. The formation of the divacancytype defects may be correlated with a discrepancy between the carrier concentration and the total


2004 ◽  
Vol 37 (21) ◽  
pp. 8035-8042 ◽  
Author(s):  
John Algers ◽  
Peter Sperr ◽  
Werner Egger ◽  
Laszlo Liszkay ◽  
Gottfried Kögel ◽  
...  

2001 ◽  
Vol 363-365 ◽  
pp. 269-271 ◽  
Author(s):  
Jozef Krištiak ◽  
P. Bandžuch ◽  
O. Šauša ◽  
J. Zrubcová ◽  
Josef Bartoš

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