Integrated-Circuit (IC) test probes have been designed variously and manufactured flexibly cause of diverse IC packaged forms. To successfully test the functions of the packaged IC, the packaged industry should carefully select a suitable probe type based on the size or pitch of the ball and the lead of the packaged IC. One plunger of the probe is used to be connected with the packaged IC; the other plunger is connected to the testing devices. A probe basically is composite of a barrel and two plungers whose head might be the crown or the pierced type. The main diameter of the probe’s barrel varies from 0.2 millimeter to 0.6 millimeter; the total length of the probe could be from 1 millimeter to 7 millimeter. The probes ought to be detected before implanting them into the housing socket. However, the presenting probe measure method, eye checking by human beings, cannot fulfill the diverse types of probes because the size of IC becomes more delicate and smaller. This paper aims to develop an intelligent system that can detect and recognize more than ten items of a probe. The experimental results demonstrate that the proposed system can effectively measure the different probes.
Development of a Probe Measurement System Applicable to the Discharge for Ion Plating.
