Dynamic failure mode analysis approach based on an improved Taguchi process capability index

2021 ◽  
pp. 108152
Author(s):  
Wanhong Li ◽  
Guangzhong Liu
Keyword(s):  
Failure Mode ◽  
Process Capability ◽  
Process Capability Index ◽  
Mode Analysis ◽  
Analysis Approach ◽  
Dynamic Failure ◽  
Capability Index ◽  
Failure Mode Analysis

Case Study and Fault Modeling for Wrong Redundancy Evaluation on DRAM Devices

2007 ◽  
Author(s):  
Martin Versen ◽  
Dorina Diaconescu ◽  
Jerome Touzel
Keyword(s):  
Failure Mode ◽  
Failure Modes ◽  
Fault Modeling ◽  
Mode Analysis ◽  
Root Cause ◽  
Failure Mode Analysis

Abstract The characterization of failure modes of DRAM is often straight forward if array related hard failures with specific addresses for localization are concerned. The paper presents a case study of a bitline oriented failure mode connected to a redundancy evaluation in the DRAM periphery. The failure mode analysis and fault modeling focus both on the root-cause and on the test aspects of the problem.

A mixed control chart using process capability index

2017 ◽  
Vol 36 (2) ◽  
pp. 278-289 ◽  
Author(s):  
Muhammad Aslam ◽  
N. Khan ◽  
Liaquat Ahmad ◽  
Chi-Hyuck Jun ◽  
Jaffer Hussain
Keyword(s):  
Control Chart ◽  
Process Capability ◽  
Process Capability Index ◽  
Capability Index ◽  
Mixed Control
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