Structural characterization of V2O5–TiO2 thin films deposited by RF sputtering from a titanium target with vanadium insets

2005 ◽  
Vol 109 (1) ◽  
pp. 47-51 ◽  
Author(s):  
I. Alessandri ◽  
E. Comini ◽  
E. Bontempi ◽  
G. Sberveglieri ◽  
L.E. Depero
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
Rf Sputtering ◽  
Tio2 Thin Films ◽  
Titanium Target

Structural characterization of DC magnetron-sputtered TiO2 thin films using XRD and Raman scattering studies

2003 ◽  
Vol 6 (5-6) ◽  
pp. 547-550 ◽  
Author(s):  
B. Karunagaran ◽  
R.T. Rajendra Kumar ◽  
V. Senthil Kumar ◽  
D. Mangalaraj ◽  
Sa.K. Narayandass ◽  
...  
Keyword(s):  
Thin Films ◽  
Raman Scattering ◽  
Structural Characterization ◽  
Tio2 Thin Films

Structural characterization of TiO2 thin films obtained by pulsed laser deposition

1999 ◽  
Vol 137 (1-4) ◽  
pp. 38-44 ◽  
Author(s):  
L. Escobar-Alarcón ◽  
E. Haro-Poniatowski ◽  
M.A. Camacho-López ◽  
M. Fernández-Guasti ◽  
J. Jı́menez-Jarquı́n ◽  
...  
Keyword(s):  
Thin Films ◽  
Pulsed Laser Deposition ◽  
Structural Characterization ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Tio2 Thin Films

Structural characterization of TiO2 thin films prepared by pulsed laser deposition on GaAs(100) substrates

2001 ◽  
Vol 174 (1) ◽  
pp. 35-39 ◽  
Author(s):  
Xiaohua Liu ◽  
J. Yin ◽  
Z.G. Liu ◽  
X.B. Yin ◽  
G.X. Chen ◽  
...  
Keyword(s):  
Thin Films ◽  
Pulsed Laser Deposition ◽  
Structural Characterization ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Tio2 Thin Films

Characterization of Cu(InxGa1−x)2Se3.5 thin films prepared by rf sputtering

1998 ◽  
Vol 50 (1-4) ◽  
pp. 13-18 ◽  
Author(s):  
Tooru Tanaka ◽  
Nobutaka Tanahashi ◽  
Toshiyuki Yamaguchi ◽  
Akira Yoshida
Keyword(s):  
Thin Films ◽  
Rf Sputtering

Structural characterization of electrodeposited EuSe thin films

2001 ◽  
Vol 36 (15) ◽  
pp. 2613-2626 ◽  
Author(s):  
N.S Gaikwad ◽  
C.H Bhosale
Keyword(s):  
Thin Films ◽  
Structural Characterization

Reactive UHV Sputtering and Structural Characterization of Epitaxial AlN/6H-SiC(0001) Thin Films

1998 ◽  
Vol 264-268 ◽  
pp. 1225-1228 ◽  
Author(s):  
Sukkaneste Tungasmita ◽  
Jens Birch ◽  
L. Hultman ◽  
Erik Janzén ◽  
J.-E. Sundgren
Keyword(s):  
Thin Films ◽  
Structural Characterization

Optical absorption and structural characterization of reactively sputtered tellurium suboxide thin films

1993 ◽  
Vol 65-66 ◽  
pp. 313-318 ◽  
Author(s):  
M. Di Giulio ◽  
M.C. Nicotra ◽  
M. Re ◽  
R. Rella ◽  
P. Siciliano
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Structural Characterization
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