Influence of aging time of the starting solution on the physical properties of fluorine doped zinc oxide films deposited by a simplified spray pyrolysis technique

2012 ◽  
Vol 51 (5) ◽  
pp. 680-689 ◽  
Author(s):  
R. Anandhi ◽  
R. Mohan ◽  
K. Swaminathan ◽  
K. Ravichandran
Keyword(s):  
Zinc Oxide ◽  
Physical Properties ◽  
Spray Pyrolysis ◽  
Aging Time ◽  
Spray Pyrolysis Technique ◽  
Oxide Films ◽  
Starting Solution ◽  
Zinc Oxide Films

scholarly journals Effect of indium doping on zinc oxide films prepared by chemical spray pyrolysis technique

2010 ◽  
Vol 33 (5) ◽  
pp. 581-587 ◽  
Author(s):  
Girjesh Singh ◽  
S. B. Shrivastava ◽  
Deepti Jain ◽  
Swati Pandya ◽  
T. Shripathi ◽  
...  
Keyword(s):  
Zinc Oxide ◽  
Spray Pyrolysis ◽  
Spray Pyrolysis Technique ◽  
Oxide Films ◽  
Chemical Spray Pyrolysis ◽  
Chemical Spray Pyrolysis Technique ◽  
Zinc Oxide Films ◽  
Indium Doping ◽  
Chemical Spray

Physical properties and growth kinetics of co-sputtered indium-zinc oxide films

2009 ◽  
Vol 24 (9) ◽  
pp. 095019 ◽  
Author(s):  
Changgang Huang ◽  
Meili Wang ◽  
Quanlin Liu ◽  
Yongge Cao ◽  
Zhonghua Deng ◽  
...  
Keyword(s):  
Zinc Oxide ◽  
Physical Properties ◽  
Growth Kinetics ◽  
Oxide Films ◽  
Zinc Oxide Films ◽  
Indium Zinc Oxide ◽  
Kinetics Of

Morphological, Structural, Electrical and Optical Properties of Copper-Doped Zinc Oxide Films Deposited by Spray Pyrolysis

2018 ◽  
Vol 930 ◽  
pp. 79-84
Author(s):  
Juliana Simões Chagas Licurgo ◽  
Herval Ramos Paes Junior
Keyword(s):  
Zinc Oxide ◽  
Spray Pyrolysis ◽  
Oxide Films ◽  
Electrical Characterization ◽  
Xrd Analysis ◽  
Band Gap Energy ◽  
Hexagonal Structure ◽  
Material Behavior ◽  
Glass Substrates ◽  
Zinc Oxide Films

In this work, copper-doped zinc oxide films (ZnO:Cu) were deposited by spray pyrolysis on glass substrates. The influence of doping concentration (0-10 at.%) on morphological, structural, optical and electrical properties of the ZnO:Cu films was investigated. Electrical characterization consisted in measuring the variation of electrical conductivity with temperature; they presented a typical semiconductor material behavior. Based on x-ray diffraction (XRD) analysis, it was able to confirm that the films are polycrystalline having a wurtzite hexagonal structure, preferentially oriented in the c-axis (002), and the crystallite size ranged from 41.60 to 50.70 nm. The optical characterization revealed that ZnO:Cu films present band gap energy between 3.18 and 3.27 eV. The films were homogeneous with good adhesion to the substrate. The results indicate the viability of using them in optoelectronic devices.

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