Effects of oxygen pressure on lattice parameter, orientation, surface morphology and deposition rate of (Ba0.02Sr0.98)TiO3 thin films grown on MgO substrate by pulsed laser deposition

ABSTRACTThe influence of an in-situ magnetic field on the plume during pulsed laser deposition (PLD) to prepare epitaxial nickel zinc ferrite (NZF) thin films were investigated. An air core coil (solenoid coil) was installed between a target and a substrate, and up to 43 mT of magnetic field was generated by direct current (DC)(Dynamic Aurora PLD method). Application of magnetic field brought about following structural and property changes;(1) deposition rate was almost doubled, (2) the concentration of Ni and Zn in the film was decreased, (3) lattice parameter was unchanged, and (4) magnetization and coercivity was increased. Since deposition rate was increased by application of magnetic field, films with same thickness was also prepared without magnetic field, however, magnetic properties were unchanged. This indicates that application of in-situ magnetic field improved magnetic properties.

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Structure and Optical Properties of SrBi2Nb2O9 Thin Films Fabricated by Pulsed Laser Deposition

Key Engineering Materials ◽

10.4028/www.scientific.net/kem.368-372.305 ◽

2008 ◽

Vol 368-372 ◽

pp. 305-307

Author(s):

Kan Song Chen ◽

Hao Shuang Gu ◽

Jian San Zou ◽

Li Wang ◽

Yi Huang

Keyword(s):

Thin Films ◽

Surface Morphology ◽

Pulsed Laser Deposition ◽

Oxygen Pressure ◽

Energy Gap ◽

Perovskite Phase ◽

Pulsed Laser ◽

Optical Transmittance ◽

Laser Deposition ◽

Layered Perovskite

SrBi2Nb2O9 (SBN) thin films were prepared on fused quartz substrates at room temperature by pulsed laser deposition. The crystallization behavior and surface morphology were studied at various oxygen pressures by XRD and AFM. The results indicated that the films had polycrystalline structure with a single layered perovskite phase, and exhibited higher crystalline quality, less rough surface morphology, and larger grain size with increasing oxygen pressure. The optical transmittance of the samples was measured in the wavelength range 200-900 nm, and the dispersion relation of refractive indices and wavelength was found to follow the single electron oscillation model. The energy gap of SBN films grown at oxygen pressure of 5 Pa was estimated to be around 3.88 eV by assuming a direct transition between valence and conduction bands.

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Effects of growth temperature and oxygen pressure on the properties of heteroepitaxial ZnO thin films on sapphire (0001) substrates by pulsed laser deposition

physica status solidi (b) ◽

10.1002/pssb.200675127 ◽

2007 ◽

Vol 244 (5) ◽

pp. 1528-1532 ◽

Cited By ~ 5

Author(s):

Chunli Liu ◽

S. H. Chang ◽

T. W. Noh ◽

J.-H. Song ◽

J. Xie

Keyword(s):

Thin Films ◽

Pulsed Laser Deposition ◽

Oxygen Pressure ◽

Growth Temperature ◽

Pulsed Laser ◽

Laser Deposition ◽

Zno Thin Films

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Pulsed laser deposition of oriented V2O5 thin films

Journal of Materials Research ◽

10.1557/jmr.2000.0323 ◽

2000 ◽

Vol 15 (10) ◽

pp. 2249-2265 ◽

Cited By ~ 17

Author(s):

Jeanne M. McGraw ◽

John D. Perkins ◽

Falah Hasoon ◽

Philip A. Parilla ◽

Chollada Warmsingh ◽

...

Keyword(s):

Thin Films ◽

Pulsed Laser Deposition ◽

Oxygen Pressure ◽

Pulsed Laser ◽

Laser Deposition ◽

Glass Substrates ◽

Wide Range ◽

Phase Pure ◽

Amorphous Quartz ◽

Quartz Substrates

We have found that by varying only the substrate temperature and oxygen pressure five different crystallographic orientations of V2O5 thin films can be grown, ranging from amorphous to highly textured crystalline. Dense, phase-pure V2O5 thin films were grown on SnO2/glass substrates and amorphous quartz substrates by pulsed laser deposition over a wide range of temperatures and oxygen pressures. The films' microstructure, crystallinity, and texturing were characterized by electron microscopy, x-ray diffraction, and Raman spectroscopy. Temperature and oxygen pressure appeared to play more significant roles in the resulting crystallographic texture than did the choice of substrate. A growth map summarizes the results and delineates the temperature and O2 pressure window for growing dense, uniform, phase-pure V2O5 films.

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