Crystal structure re-investigation in wide band gap CIGSe compounds

2009 ◽  
Vol 517 (7) ◽  
pp. 2145-2148 ◽  
Author(s):  
M. Souilah ◽  
X. Rocquefelte ◽  
A. Lafond ◽  
C. Guillot-Deudon ◽  
J.-P. Morniroli ◽  
...  
2020 ◽  
Vol 20 (3) ◽  
pp. 1422-1433 ◽  
Author(s):  
Mallesham Bandi ◽  
Vishal Zade ◽  
Swadipta Roy ◽  
Aruna N. Nair ◽  
Sierra Seacat ◽  
...  

2008 ◽  
Vol 92 (24) ◽  
pp. 241923 ◽  
Author(s):  
M. Souilah ◽  
A. Lafond ◽  
N. Barreau ◽  
C. Guillot-Deudon ◽  
J. Kessler

2014 ◽  
Vol 10 (3) ◽  
pp. 2532-2539 ◽  
Author(s):  
H. Saadouni ◽  
D. E. Janzen ◽  
M. Rzaigui ◽  
W.Smirani Sta

The synthesis, crystal structure and spectroscopic studies are reported for the salt m-anisidinium nitrate. A single-crystal  X-ray investigation has shown that this compound crystallizes in the non-centrosymmetric space group Cc with the lattice parameters: a = 5.744(3) Å, b = 14.968(6) Å, c = 10.178(4) Å; b  = 96.910(7)o; V = 868.6(6)Å3 ; Z = 4. The structure was solved from 1973 independent reflections with R1 = 0.033 and wR2 = 0.088. The hydrogen atoms of the protonated amine undergo hydrogen bonding interactions with oxygen atoms of three different nitrate anions forming 2-dimensional sheets. Solution NMR results are consistent with the X-ray structure. A measured optical band gap of 3.35eV indicates m-anisidinium nitrate is a wide-band-gap dielectric material.


Author(s):  
Joanna L. Batstone

Interest in II-VI semiconductors centres around optoelectronic device applications. The wide band gap II-VI semiconductors such as ZnS, ZnSe and ZnTe have been used in lasers and electroluminescent displays yielding room temperature blue luminescence. The narrow gap II-VI semiconductors such as CdTe and HgxCd1-x Te are currently used for infrared detectors, where the band gap can be varied continuously by changing the alloy composition x.Two major sources of precipitation can be identified in II-VI materials; (i) dopant introduction leading to local variations in concentration and subsequent precipitation and (ii) Te precipitation in ZnTe, CdTe and HgCdTe due to native point defects which arise from problems associated with stoichiometry control during crystal growth. Precipitation is observed in both bulk crystal growth and epitaxial growth and is frequently associated with segregation and precipitation at dislocations and grain boundaries. Precipitation has been observed using transmission electron microscopy (TEM) which is sensitive to local strain fields around inclusions.


Author(s):  
Raquel Caballero ◽  
Leonor de la Cueva ◽  
Andrea Ruiz-Perona ◽  
Yudenia Sánchez ◽  
Markus Neuschitzer ◽  
...  

2013 ◽  
Vol 28 (6) ◽  
pp. 671-676 ◽  
Author(s):  
Yu-Qing ZHANG ◽  
Li-Li ZHAO ◽  
Shi-Long XU ◽  
Chao ZHANG ◽  
Xiao-Ying CHEN ◽  
...  

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