scholarly journals Optical characterization by variable angle spectroscopic ellipsometry of nitrogen-doped Mg Zn1−O thin films prepared by the plasma-assisted reactive evaporation method

2014 ◽  
Vol 571 ◽  
pp. 615-619 ◽  
Author(s):  
Takami Abe ◽  
Akira Nakagawa ◽  
Michiko Nakagawa ◽  
Tetsuya Chiba ◽  
Shuzo Takahashi ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Characterization ◽  
Evaporation Method ◽  
Nitrogen Doped ◽  
Reactive Evaporation ◽  
Variable Angle ◽  
Variable Angle Spectroscopic Ellipsometry

Optical Characterization of Silicon Oxynitride Thin Films by Variable Angle Spectroscopic Ellipsometry

1992 ◽  
Vol 18 (2) ◽  
pp. 124-128 ◽  
Author(s):  
Yi-Ming Xiong ◽  
Paul G. Snyder ◽  
John A. Woollam ◽  
G. A. Al-Jumaily ◽  
F. J. Gagliardi ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Characterization ◽  
Silicon Oxynitride ◽  
Variable Angle ◽  
Variable Angle Spectroscopic Ellipsometry

Optical Properties of GaN Thin Films on Sapphire Substrates Characterized by Variable-Angle Spectroscopic Ellipsometry

1998 ◽  
Vol 37 (Part 2, No. 10A) ◽  
pp. L1105-L1108 ◽  
Author(s):  
Tao Yang ◽  
Shigeo Goto ◽  
Masahiko Kawata ◽  
Kenji Uchida ◽  
Atsuko Niwa ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Sapphire Substrates ◽  
Variable Angle ◽  
Variable Angle Spectroscopic Ellipsometry
Sign in / Sign up

Export Citation Format

Share Document