scholarly journals Surface topography and optical properties of Ge-Sb(As)-S-Te thin films by atomic-force microscopy and variable angle spectroscopic ellipsometry

2012 ◽  
Vol 356 ◽  
pp. 012019 ◽  
Author(s):  
N Dulgheru (Nedelcu) ◽  
M Anastasescu ◽  
M Nicolescu ◽  
M Stoica ◽  
M Gartner ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Optical Properties ◽  
Surface Topography ◽  
Spectroscopic Ellipsometry ◽  
Force Microscopy ◽  
Atomic Force ◽  
Variable Angle ◽  
Variable Angle Spectroscopic Ellipsometry

Optical Properties of GaN Thin Films on Sapphire Substrates Characterized by Variable-Angle Spectroscopic Ellipsometry

1998 ◽  
Vol 37 (Part 2, No. 10A) ◽  
pp. L1105-L1108 ◽  
Author(s):  
Tao Yang ◽  
Shigeo Goto ◽  
Masahiko Kawata ◽  
Kenji Uchida ◽  
Atsuko Niwa ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Sapphire Substrates ◽  
Variable Angle ◽  
Variable Angle Spectroscopic Ellipsometry

scholarly journals Morphology and Spectroscopic Ellipsometry of PMMA Thin Films

2017 ◽  
Vol 9 (2) ◽  
pp. 5 ◽  
Author(s):  
H. M. El-Nasser
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Silicon Substrates ◽  
Analysis Method ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mean Grain Size ◽  
Multiple Sample ◽  
Ellipsometry Data

The morphology and optical properties of PMMA thin films deposited on silicon substrates were investigated. The spin coated films were characterized by atomic force microscopy and spectroscopic ellipsometry. Regardless that, the samples were deposited at different coating speeds, the surface structures of all PMMA thin films were consistent, and found to be relatively smooth, with a mean grain size in the range of 13-25 nm. The refractive index as well as the extinction coefficient of the films was determined using spectroscopic ellipsometry data over the wavelength range 380-750 nm. For this purpose, we used the Cauchy dispersion relation in order to represent PMMA layers, and then models were built by adding a roughness layer, which simply corrects any possible deviation from planarity. Besides, the thicknesses of all four films were calculated simultaneously based on multiple sample analysis method. By using this method, optical properties were coupled in such way that, the optical constants for all samples were assumed to be identical.

SURFACE TOPOGRAPHY ON EPITAXIAL HoBa2Cu3O7-δ AND Bi2Sr2CaCu2O8+δ THIN FILMS

2002 ◽  
Vol 09 (05n06) ◽  
pp. 1729-1733
Author(s):  
W. LOPERA ◽  
D. GIRATÁ ◽  
F. PÉREZ ◽  
L. F. CASTRO ◽  
E. BACA ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
High Pressure ◽  
Surface Morphology ◽  
Surface Topography ◽  
Chemical Etching ◽  
Film Surface ◽  
Force Microscopy ◽  
Atomic Force

Surface topography on epitaxial HoBa 2 Cu 3 O 7-δ (HBCO) and Bi 2 Sr 2 CaCu 2 O 8+δ (BSCCO) thin films analysis by using the atomic force microscopy (AFM) technique was carried out. The films were deposited in situ on SrTiO 3 substrates with thicknesses ranging from 100 to 300 nm by a high-pressure sputtering process. Chemical etching with a nonaqueous solution of Br-ethanol was used to modify the surface of the samples. HBCO films showed spiral grains, while BSCCO samples exhibited a terraced growth. Etching with Br-ethanol has different effects on HBCO and BSCCO. In HBCO, etching produces clean surfaces with light changes on the surface morphology, whereas in BSCCO it conduces to strong changes in the structure and the roughness of the film surface.

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