Spherical aberration correction with an in-lens N-fold symmetric line currents model

2018 ◽  
Vol 187 ◽  
pp. 135-143 ◽  
Author(s):  
Shahedul Hoque ◽  
Hiroyuki Ito ◽  
Ryuji Nishi
2016 ◽  
Vol 161 ◽  
pp. 74-82 ◽  
Author(s):  
Shahedul Hoque ◽  
Hiroyuki Ito ◽  
Ryuji Nishi ◽  
Akio Takaoka ◽  
Eric Munro

2002 ◽  
Author(s):  
Edwin P. Walker ◽  
Jacques Duparre ◽  
Haichuan Zhang ◽  
Wenyi Feng ◽  
Yi Zhang ◽  
...  

2004 ◽  
Vol 236 (1-3) ◽  
pp. 145-150 ◽  
Author(s):  
Eirini Theofanidou ◽  
Laurence Wilson ◽  
William J. Hossack ◽  
Jochen Arlt

2008 ◽  
Vol 51 (11) ◽  
pp. 714-718 ◽  
Author(s):  
Yasumasa TANISHIRO ◽  
Yukihito KONDO ◽  
Kunio TAKAYANAGI

2008 ◽  
Vol 14 (1) ◽  
pp. 2-15 ◽  
Author(s):  
David J. Smith

The successful correction of spherical aberration is an exciting and revolutionary development for the whole field of electron microscopy. Image interpretability can be extended out to sub-Ångstrom levels, thereby creating many novel opportunities for materials characterization. Correction of lens aberrations involves either direct (online) hardware attachments in fixed-beam or scanning TEM or indirect (off-line) software processing using either off-axis electron holography or focal-series reconstruction. This review traces some of the important steps along the path to realizing aberration correction, including early attempts with hardware correctors, the development of online microscope control, and methods for accurate measurement of aberrations. Recent developments and some initial applications of aberration-corrected electron microscopy using these different approaches are surveyed. Finally, future prospects and problems are briefly discussed.


2012 ◽  
Vol 52 (9-10) ◽  
pp. 2120-2122 ◽  
Author(s):  
Y. Lu ◽  
E. Ramsay ◽  
C.R. Stockbridge ◽  
A. Yurt ◽  
F.H. Köklü ◽  
...  

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