Spherical-aberration correction in tandem with the restoration of the exit-plane wavefunction: synergetic tools for the imaging of lattice imperfections in crystalline solids at atomic resolution

2006 ◽  
Vol 41 (14) ◽  
pp. 4420-4433 ◽  
Author(s):  
Karsten Tillmann ◽  
Lothar Houben ◽  
Andreas Thust ◽  
Knut Urban
Keyword(s):  
Spherical Aberration ◽  
Atomic Resolution ◽  
Aberration Correction ◽  
Crystalline Solids ◽  
Exit Plane

Spherical aberration correction for two-photon recorded monolithic multilayer optical data storage

2002 ◽  
Author(s):  
Edwin P. Walker ◽  
Jacques Duparre ◽  
Haichuan Zhang ◽  
Wenyi Feng ◽  
Yi Zhang ◽  
...  
Keyword(s):  
Data Storage ◽  
Spherical Aberration ◽  
Optical Data Storage ◽  
Optical Data ◽  
Aberration Correction ◽  
Two Photon

scholarly journals FEI Titan 80-300 TEM

2016 ◽  
Vol 2 ◽  
Author(s):  
Andreas Thust ◽  
Juri Barthel ◽  
Karsten Tillmann
Keyword(s):  
Electron Microscope ◽  
Solid State ◽  
Spherical Aberration ◽  
Atomic Scale ◽  
Atomic Resolution ◽  
Lens System ◽  
Stage Design ◽  
Precise Positioning ◽  
Transmission Electron ◽  
Wide Range

The FEI Titan 80-300 TEM is a high-resolution transmission electron microscope equipped with a field emission gun and a corrector for the spherical aberration (<em>C</em><sub>S</sub>) of the imaging lens system. The instrument is designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale, which requires true atomic resolution capabilities. Under optimum optical settings of the image <em>C</em><sub>S</sub>-corrector (CEOS CETCOR) the point-resolution is extended up to the information limit of well below 100 pm with 200 keV and 300 keV electrons. A special piezo-stage design allows ultra-precise positioning of the specimen in all 3 dimensions. Digital images are acquired with a Gatan 2k x 2k slow-scan charged coupled device camera.

Spherical aberration correction for optical tweezers

2004 ◽  
Vol 236 (1-3) ◽  
pp. 145-150 ◽  
Author(s):  
Eirini Theofanidou ◽  
Laurence Wilson ◽  
William J. Hossack ◽  
Jochen Arlt
Keyword(s):  
Optical Tweezers ◽  
Spherical Aberration ◽  
Aberration Correction

The Effect of Local Symmetry on Atomic Resolution EELS Near-Edge Structures: Predictions for Grain Boundaries In NiAl

2000 ◽  
Vol 6 (S2) ◽  
pp. 186-187
Author(s):  
D. A. Pankhurst ◽  
G. A. Botton ◽  
C. J. Humphreys
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Local Density ◽  
Spherical Aberration ◽  
Core Loss ◽  
Atomic Scale ◽  
Atomic Resolution ◽  
Atomic Column ◽  
Edge Structure ◽  
Electron Energy Loss

It has been demonstrated that electron energy loss spectrometry (EELS) can be used to probe the electronic structure of materials on the near-atomic scale. The electron energy loss near edge structure (ELNES) observed after the onset of a core edge reflects a weighted local density of final states to which core electrons are excited by fast incident electrons. Lately ‘atomic resolution EELS’ and ‘column-by-column spectroscopy’ have become familiar themes amongst the EELS community. The next generation of STEMs, equipped with spherical aberration (Cs) correctors and electron beam monochromators, will have sufficient spatial and energy resolution, along with the superior signal to noise required, to detect small changes in the ELNES from atomic column to atomic column.Core loss ELNES provides information about unoccupied states, but the structure observed in spectra is sensitive to changes in the underlying occupied states, and thus to the bonding in the material.

scholarly journals Development of Domestic Spherical Aberration Correction Electron Microscope, R005

2008 ◽  
Vol 51 (11) ◽  
pp. 714-718 ◽  
Author(s):  
Yasumasa TANISHIRO ◽  
Yukihito KONDO ◽  
Kunio TAKAYANAGI
Keyword(s):  
Electron Microscope ◽  
Spherical Aberration ◽  
Aberration Correction

Development of Aberration-Corrected Electron Microscopy

2008 ◽  
Vol 14 (1) ◽  
pp. 2-15 ◽  
Author(s):  
David J. Smith
Keyword(s):  
Electron Microscopy ◽  
Spherical Aberration ◽  
Materials Characterization ◽  
Electron Holography ◽  
Aberration Correction ◽  
Future Prospects ◽  
Microscopy Image ◽  
Recent Developments ◽  
Fixed Beam ◽  
Aberration Corrected

The successful correction of spherical aberration is an exciting and revolutionary development for the whole field of electron microscopy. Image interpretability can be extended out to sub-Ångstrom levels, thereby creating many novel opportunities for materials characterization. Correction of lens aberrations involves either direct (online) hardware attachments in fixed-beam or scanning TEM or indirect (off-line) software processing using either off-axis electron holography or focal-series reconstruction. This review traces some of the important steps along the path to realizing aberration correction, including early attempts with hardware correctors, the development of online microscope control, and methods for accurate measurement of aberrations. Recent developments and some initial applications of aberration-corrected electron microscopy using these different approaches are surveyed. Finally, future prospects and problems are briefly discussed.

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