Effect of the hydrogen and argon ion-beam treatments on the structural and electrical properties of Cz Si wafers: Comparative study

Vacuum ◽  
2009 ◽  
Vol 83 ◽  
pp. S99-S102 ◽  
Author(s):  
O. Zinchuk ◽  
N. Drozdov ◽  
A. Fedotov ◽  
A. Mazanik ◽  
N. Krekotsen ◽  
...  
2017 ◽  
Vol 24 (03) ◽  
pp. 1750038 ◽  
Author(s):  
A. M. ABDEL REHEEM ◽  
A. ATTA ◽  
T. A. AFIFY

In this work, PVA/Ag nanocomposites films were prepared using solution casting technique, these films were irradiated with Argon ion beam to modify the structure. The main objective of the study is to enhance the optical and electrical properties of the polymer nanocomposites films by irradiation. The conventional characterization techniques such as UV–Visible spectroscopy, X-ray diffraction (XRD), Fourier transform infrared (FTIR), transmission electron microscope (TEM) and dielectric measurement are employed to understand the structure–property relations. FTIR analysis of these composite films shows chemical changes and a significant impact on them can be observed after irradiation. After doping, the XRD data shows silver nanoparticles formation in the PVA polymer. The band gap energy of samples is decreased with increases in the concentration of silver nanoparticles and ion beam fluence, which gives clear indication that ion beam irradiation induced defects are formed in the composite systems. The electrical conductivity, dielectric loss [Formula: see text] and dielectric constant [Formula: see text] are increased with increasing ion beam fluence and Ag dopant concentration.


2006 ◽  
Vol 29 (2) ◽  
pp. 187-191 ◽  
Author(s):  
Garima Agarwal ◽  
Ankur Jain ◽  
Shivani Agarwal ◽  
D. Kabiraj ◽  
I. P. Jain

RSC Advances ◽  
2014 ◽  
Vol 4 (80) ◽  
pp. 42514-42522 ◽  
Author(s):  
Dhrubojyoti Roy ◽  
Nayan Mani Das ◽  
Nanda Shakti ◽  
P. S. Gupta

Model representing growth mechanism in the LB thin film during phase transformation from α- to β-phase on annealing.


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