Characterizing the Chemical Structure of Ti3C2Tx MXene by Angle-Resolved XPS Combined with Argon Ion Etching

Angle-resolved XPS combined with argon ion etching was used to characterize the surface functional groups and the chemical structure of Ti3C2Tx MXene. Survey scanning obtained on the sample surface showed that the sample mainly contains C, O, Ti and F elements, and a little Al element. Analyzing the angle-resolved narrow scanning of these elements indicated that a layer of C and O atoms was adsorbed on the top surface of the sample, and there were many O or F related Ti bonds except Ti–C bond. XPS results obtained after argon ion etching indicated staggered distribution between C–Ti–C bond and O–Ti–C, F–Ti bond. It is confirmed that Ti atoms and C atoms were at the center layer of Ti3C2Tx MXene, while O atoms and F atoms were located at both the upper and lower surface of Ti3C2 layer acting as surface functional groups. The surface functional groups on the Ti3C2 layer were determined to include O2−, OH−, F− and O−–F−, among which F atoms could also desorb from Ti3C2Tx MXene easily. The schematic atomic structure of Ti3C2Tx MXene was derived from the analysis of XPS results, being consistent with theoretical chemical structure and other experimental reports. The results showed that angle-resolved XPS combing with argon ion etching is a good way to analysis 2D thin layer materials.

Influence of argon ion irradiation dose on the formation of the surface layers composition and changing mechanical properties of ion-plasma coated carbon steel

The effect of argon ion irradiation with an energy of 40 keV in the dose range of 1016 - 1018 ion/cm2 on the formation of the surface layers composition, changes in the morphology and mechanical properties (microhardness, and wear resistance) of carbon steel AISI 1020 with a deposited ion-plasma coating Ni80Cr20 was studied. It is shown that irradiation with doses greater than 1017 ion/cm2 leads to the formation of a layer consisting of nickel, chromium and iron. The most optimal treatment mode for improving wear resistance is irradiation with a dose of 5.1017 ion/cm2.

Microstructural and Energy-Dispersive X-ray Analyses on Argon Ion Implantations in Tantalum Thin Films for Microelectronic Substrates

In the present study, the microstructural and statistical properties of unimplanted in comparison to argon ion-implanted tantalum-based thin film surface structures are investigated for potential application in microelectronic thin film substrates. In the study, the argon ions were implanted at the energy of 30 keV and the doses of 1×1017, 3×1017, and 7×1017 (ion/cm2) at an ambient temperature. Two primary goals have been pursued in this study. First, by using atomic force microscopy (AFM) analysis, the roughness of samples, before and after implantation, has been studied. The corrosion apparatus wear has been used to compare resistance against tantalum corrosion for all samples. The results show an increase in resistance against tantalum corrosion after the argon ion implantation process. After the corrosion test, scanning electron microscopy (SEM) analysis was applied to study the sample morphology. The elemental composition of the samples was characterized by using energy-dispersive X-ray (EDX) analysis. Second, the statisticalcharacteristics of both unimplanted and implanted samples, using the monofractal analysis with correlation function and correlation length of samples, were studied. The results show, however, that all samples are correlated and that the variation of ion doses has a negligible impact on the values of correlation lengths. Moreover, the study of height distribution and higher-order moments show the deviation from Gaussian distribution. The calculations of the roughness exponent and fractal dimension indicates that the implanted samples are the self-affine fractal surfaces.

MATHEMATICAL MODEL OF THE INTERACTION OF LOW-ENERGY INERT GAS IONS WITH POLYPROPYLENE IN RADIO-FREQUENCY PLASMA OF LOW PRESSURE

Results of the molecular dynamic simulation of the interaction of low-energy ions (from 10 to 100 eV) with the surface of polypropylene fibrous materials in low pressure radio-frequency (RF) argon plasma is presented. A full-atomic model using the LAMMPS classical molecular dynamics code was made. As a result of numerical calculations, it was found that argon ion bombardment initiates the breaking both of an intermolecular and intramolecular bond of polypropylene with sputtered particles being the hydrocarbon radicals and single atoms. The depth of implantation of the ion is determined, the change in the kinetic energy of the argon atom and the temperature of the simulated cell is obtained.

Evaluation of Toraja (Indonesia) local aromatic rice mutant developed using heavy-ion beam irradiation

Okasa AM, Sjahril R, Riadi M, Mahendradatta M, Sato T, Toriyama K, Ishii K, Hayashi Y, Abe T. 2021. Evaluation of Toraja (Indonesia) local aromatic rice mutant developed using heavy-ion beam irradiation. Biodiversitas 22: 3474-3481. The aromatic local Toraja rice "Pare Bau" has a good grain quality and aroma. However, it has some disadvantages, including a late heading and low yield for a modern farming system. This study aims to evaluate and select early heading as well as high yield mutant lines induced by heavy-ion beam irradiation. Furthermore, dry seeds of Pare Bau were irradiated with Argon-ion (300 keV/?m) and Carbon-ion (30 keV/?m) at RI-beam factory, RIKEN Nishina Center, Japan. The germination percentages of the M1 seeds were 49% for Pare Bau irradiated with Argon-ion (PB-A), 53% for Pare Bau irradiated with Carbon-ion (PB-C), and 70% for the Control. The 13 PB-A and 13 PB-C M1 plants were selected, and the seeds were sampled in the paddy field of Hasanuddin University (20 m asl.), Makassar. During the following planting season, the M2 generation plant was examined in Enrekang District (650 m asl.), South Sulawesi, Indonesia. Based on the early heading and a larger number of panicles, the 18 PB-A and one PB-C M3 line were selected from a total of 404 M2 survival plants. The selected lines and control were grouped into seven clusters based on the quantitative phenotypic traits, indicating the existence of genetic variability. The plant yield was significantly correlated with plant height, the number of tillers, the number of panicles, as well as grain weight per panicle, which showed that these traits are good criteria for selection.