Structural and spectroscopic modifications of nanocrystalline zinc oxide films induced by swift heavy ions

Vacuum ◽  
2011 ◽  
Vol 86 (1) ◽  
pp. 87-90 ◽  
Author(s):  
Sebiha Rehman ◽  
R.G. Singh ◽  
J.C. Pivin ◽  
Waseem Bari ◽  
Fouran Singh
Keyword(s):  
Zinc Oxide ◽  
Heavy Ions ◽  
Oxide Films ◽  
Swift Heavy Ions ◽  
Zinc Oxide Films ◽  
Nanocrystalline Zinc Oxide

Tribological behavior of nanocrystalline zinc oxide films

Wear ◽  
1997 ◽  
Vol 203-204 ◽  
pp. 498-506 ◽  
Author(s):  
S.V. Prasad ◽  
J.S. Zabinski
Keyword(s):  
Zinc Oxide ◽  
Tribological Behavior ◽  
Oxide Films ◽  
Zinc Oxide Films ◽  
Nanocrystalline Zinc Oxide

scholarly journals Resistive switching control in forming-free nanocrystalline zinc oxide films

2020 ◽  
Vol 1695 ◽  
pp. 012040
Author(s):  
R V Tominov ◽  
A A Avakyan ◽  
V I Avilov ◽  
V A Smirnov ◽  
O A Ageev
Keyword(s):  
Zinc Oxide ◽  
Resistive Switching ◽  
Oxide Films ◽  
Switching Control ◽  
Zinc Oxide Films ◽  
Nanocrystalline Zinc Oxide

Morphology, photochemical and photocatalytic properties of nanocrystalline zinc oxide films

2012 ◽  
Vol 48 (5) ◽  
pp. 331-337 ◽  
Author(s):  
A. V. Kozytskiy ◽  
A. L. Stroyuk ◽  
S. Ya. Kuchmy ◽  
N. A. Skorik ◽  
V. O. Moskalyuk
Keyword(s):  
Zinc Oxide ◽  
Oxide Films ◽  
Photocatalytic Properties ◽  
Zinc Oxide Films ◽  
Nanocrystalline Zinc Oxide

Spectroscopic determination of the flatband potential of transparent nanocrystalline zinc oxide films

1993 ◽  
Vol 97 (42) ◽  
pp. 11081-11086 ◽  
Author(s):  
Gareth Redmond ◽  
Angela O'Keeffe ◽  
Carol Burgess ◽  
Ciara MacHale ◽  
Donald Fitzmaurice
Keyword(s):  
Zinc Oxide ◽  
Oxide Films ◽  
Spectroscopic Determination ◽  
Zinc Oxide Films ◽  
Nanocrystalline Zinc Oxide

Softening of phonons by lattice defects and structural strain in heavy ion irradiated nanocrystalline zinc oxide films

2011 ◽  
Vol 110 (8) ◽  
pp. 083520 ◽  
Author(s):  
Fouran Singh ◽  
R. G. Singh ◽  
Vinod Kumar ◽  
S. A. Khan ◽  
J. C. Pivin
Keyword(s):  
Zinc Oxide ◽  
Oxide Films ◽  
Heavy Ion ◽  
Lattice Defects ◽  
Zinc Oxide Films ◽  
Nanocrystalline Zinc Oxide ◽  
Structural Strain

Analysis of Sputtered Zinc Oxide Films

1980 ◽  
Vol 38 ◽  
pp. 416-417
Author(s):  
T. A. Emma ◽  
M. P. Singh
Keyword(s):  
Electron Microscopy ◽  
Zinc Oxide ◽  
Piezoelectric Materials ◽  
Oxide Films ◽  
Optical Quality ◽  
Zno Films ◽  
Rf Power ◽  
X Ray Diffraction ◽  
Sputtered Films ◽  
Zinc Oxide Films

Optical quality zinc oxide films have been characterized using reflection electron diffraction (RED), replication electron microscopy (REM), scanning electron microscopy (SEM), and X-ray diffraction (XRD). Significant microstructural differences were observed between rf sputtered films and planar magnetron rf sputtered films. Piezoelectric materials have been attractive for applications to integrated optics since they provide an active medium for signal processing. Among the desirable physical characteristics of sputtered ZnO films used for this and related applications are a highly preferred crystallographic texture and relatively smooth surfaces. It has been found that these characteristics are very sensitive to the type and condition of the substrate and to the several sputtering parameters: target, rf power, gas composition and substrate temperature.

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