A survey on nonlinear analog-to-digital converters

Analog To Digital ◽

Nonlinear Analog

A new approach for compensating memory nonlinear analog-to-digital converters using look-up tables

2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS) ◽

10.1109/icecs.2016.7841190 ◽

2016 ◽

Author(s):

Bryce Minger ◽

Guillaume Ferre ◽

Dominique Dallet ◽

Loic Fuche

Keyword(s):

New Approach ◽

Analog To Digital ◽

Nonlinear Analog

On the Signature Analysis of Analog-to-Digital Converters

i-manager’s Journal on Software Engineering ◽

10.26634/jse.4.3.1117 ◽

2010 ◽

Vol 4 (3) ◽

pp. 44-49

Author(s):

Vadim Geurkov ◽

L. Kirischian

Keyword(s):

Signature Analysis ◽

CAD/EDA, MODELING AND SIMULATION IN MODERN ELECTRONICS: COLLECTION OF SCIENTIFIC PAPERS OF THE III INTERNATIONAL SCIENTIFIC AND PRACTICAL CONFERENCE ◽

MODELING OF ANALOG-TO-DIGITAL CONVERTERS IN THE MULTISIM

10.30987/conferencearticle_5e0282150b0a94.52925909 ◽

2019 ◽

Author(s):

Aleksandr Shtin

Keyword(s):

Electronic Devices ◽

Analog To Digital ◽

Functional Units

The report examined the features of modeling in Multisim such functional units of electronic devices as analog-to-digital converters.

An ICA Framework for Digital Background Calibration of Analog-to-Digital Converters

Sampling Theory, Signal Processing, and Data Analysis ◽

10.1007/bf03549557 ◽

2012 ◽

Vol 11 (2-3) ◽

pp. 253-270

Author(s):

Yun Chiu ◽

Seung-Chul Lee ◽

Wenbo Liu

Keyword(s):

Background Calibration ◽

Analog To Digital ◽

Digital Background Calibration

Design and Characterization of a Sampling System Based on $\Sigma$–$\Delta$ Analog-to-Digital Converters for Electrical Metrology

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2008.2010575 ◽

2009 ◽

Vol 58 (4) ◽

pp. 786-790 ◽

Cited By ~ 10

Author(s):

R. Iuzzolino ◽

L. Palafox ◽

W.G. Kurten Ihlenfeld ◽

E. Mohns ◽

C. Brendel

Keyword(s):

Sampling System ◽

Sigma Delta ◽

Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) ◽

Phase-plane characterization of analog-to-digital converters

10.1109/imtc.2004.1351105 ◽

2004 ◽

Cited By ~ 1

Author(s):

C.L. Monteiro ◽

P. Arpaia ◽

A.C. Serra

Keyword(s):

Phase Plane ◽

A new method for testing the effective number of bits of analog to digital converters

1996 IEEE Nuclear Science Symposium. Conference Record ◽

10.1109/nssmic.1996.591036 ◽

2002 ◽

Author(s):

J. Basilio Simoes ◽

C.F.M. Loureiro ◽

J. Landeck ◽

C.M.B.A. Correia

Keyword(s):

New Method ◽

Effective Number ◽

A Calibration Method for Nonlinear Mismatches in M-Channel Time-Interleaved Analog-to-Digital Converters Based on Hadamard Sequences

Applied Sciences ◽

10.3390/app6110362 ◽

2016 ◽

Vol 6 (11) ◽

pp. 362 ◽

Cited By ~ 3

Author(s):

Husheng Liu ◽

Yinan Wang ◽

Nan Li ◽

Hui Xu

Keyword(s):

Calibration Method ◽

Analog To Digital ◽

Time Interleaved

Analog-to-Digital Converters of Components of a Displacement based on Primary Electromechanical Converters

Measurement Techniques ◽

10.1007/s11018-013-0324-9 ◽

2013 ◽

Vol 56 (9) ◽

pp. 1026-1030 ◽

Cited By ~ 1

Author(s):

Yu. S. Smirnov ◽

T. A. Kozina ◽

P. B. Serebryakov

Keyword(s):

Analog To Digital ◽

Displacement Based

Embedded analog-to-digital converters

2009 Proceedings of ESSCIRC ◽

10.1109/esscirc.2009.5325932 ◽

2009 ◽

Cited By ~ 7

Author(s):

Klaas Bult

Keyword(s):