An examination of the Munsell Color system. I. Spectral and total reflection and the Munsell scale of value

1920 ◽  
Vol 190 (4) ◽  
pp. 568
Author(s):  
Irwin G. Priest ◽  
K.S. Gibson ◽  
H.J. McNicholas
Keyword(s):  
Total Reflection ◽  
Color System ◽  
Munsell Scale

Contribution of x-ray total reflection to the background intensity in EPMA

1990 ◽  
Vol 48 (2) ◽  
pp. 202-203
Author(s):  
Werner P. Rehbach ◽  
Peter Karduck
Keyword(s):  
Atomic Number ◽  
Target Material ◽  
Total Reflection ◽  
Background Intensity ◽  
X Rays ◽  
Characteristic Radiation ◽  
X Ray

In the EPMA of soft x rays anomalies in the background are found for several elements. In the literature extremely high backgrounds in the region of the OKα line are reported for C, Al, Si, Mo, and Zr. We found the same effect also for Boron (Fig. 1). For small glancing angles θ, the background measured using a LdSte crystal is significantly higher for B compared with BN and C, although the latter are of higher atomic number. It would be expected, that , characteristic radiation missing, the background IB (bremsstrahlung) is proportional Zn by variation of the atomic number of the target material. According to Kramers n has the value of unity, whereas Rao-Sahib and Wittry proposed values between 1.12 and 1.38 , depending on Z, E and Eo. In all cases IB should increase with increasing atomic number Z. The measured values are in discrepancy with the expected ones.

Determination of some heavy metals (Fe, Cu, Zn and Pb) in blood by total reflection X-ray fluorescence

2003 ◽  
Vol 107 ◽  
pp. 203-206 ◽  
Author(s):  
M. Bounakhla ◽  
A. Doukkali ◽  
K. Lalaoui ◽  
H. Aguenaou ◽  
N. Mokhtar ◽  
...  
Keyword(s):  
Heavy Metals ◽  
Total Reflection ◽  
X Ray

On birefringence phenomena, associated with total reflection

1973 ◽  
Vol 34 (5-6) ◽  
pp. 335-340 ◽  
Author(s):  
B. Julia ◽  
A. Neveu
Keyword(s):  
Total Reflection

A Design of High-Accuracy Displacement Measurement Instrument from Principles of Optics

2012 ◽  
Vol 170-173 ◽  
pp. 2924-2928
Author(s):  
Sheng Biao Chen ◽  
Yun Zhi Tan
Keyword(s):  
Measurement Instrument ◽  
High Accuracy ◽  
Mechanical Tests ◽  
Total Reflection ◽  
Displacement Measurement ◽  
New Method ◽  
Water Volume ◽  
Water Drainage ◽  
Accuracy Of Measurement ◽  
Better Than

In order to measure the water drainage volume in soil mechanical tests accurately, it develop a new method which is based on principles of optics. And from both physical and mathematic aspects, it deduces the mathematic relationship between micro change in displacement and the increment projected on screen. The result shows that total reflection condition is better than refraction condition. What’s more, the screen could show the water volume micro variation clearly, so it can improve the accuracy of measurement.

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