Atomic force microscopy investigation of dislocation structures and deformation characteristics in neutron irradiated silicon detectors

Author(s):  
G. Golan ◽  
E. Rabinovich ◽  
A. Inberg ◽  
A. Axelevitch ◽  
M. Oksman ◽  
...  
Sign in / Sign up

Export Citation Format

Share Document