Surface morphology and helium retention on tungsten exposed to low energy and high flux helium plasma

2003 ◽  
Vol 313-316 ◽  
pp. 92-96 ◽  
Author(s):  
K. Tokunaga ◽  
R.P. Doerner ◽  
R. Seraydarian ◽  
N. Noda ◽  
Y. Kubota ◽  
...  
2021 ◽  
Vol 11 (4) ◽  
pp. 1619
Author(s):  
Jing Yan ◽  
Xia Li ◽  
Kaigui Zhu

The surface morphology of pure W bulks and nanocrystalline tungsten films was investigated after exposure to a low-energy (100 eV/D), high-flux (1.8 × 1021 D·m−2s−1) deuterium plasma. Nanocrystalline tungsten films of 6 μm thickness were deposited on tungsten bulks and exposed to deuterium plasma at various fluences ranging from 1.30 × 1025 to 5.18 × 1025 D·m−2. Changes in surface morphology from before to after irradiation were studied with scanning electron microscopy (SEM). The W bulk exposed to low-fluence plasma (1.30 × 1025 D·m−2) shows blisters. The blisters on the W bulk irradiated to higher-fluence plasma are much larger (~2 µm). The blisters on the surface of W films are smaller in size and lower in density than those of the W bulks. In addition, the modifications exhibit the appearance of cracks below the surface after deuterium plasma irradiation. It is suggested that the blisters are caused by the diffusion and aggregation of the deuterium-vacancy clusters. The deuterium retention of the W bulks and nanocrystalline tungsten films was studied using thermal desorption spectroscopy (TDS). The retention of deuterium in W bulks and W films increases with increasing deuterium plasma fluence when irradiated at 500 K.


2014 ◽  
Vol 454 (1-3) ◽  
pp. 136-141 ◽  
Author(s):  
V.Kh. Alimov ◽  
Y. Hatano ◽  
K. Sugiyama ◽  
M. Balden ◽  
M. Oyaidzu ◽  
...  

2005 ◽  
Vol 46 (3) ◽  
pp. 561-564 ◽  
Author(s):  
Dai Nishijima ◽  
Mitsutaka Miyamoto ◽  
Hirotomo Iwakiri ◽  
Minyou Ye ◽  
Noriyasu Ohno ◽  
...  

2012 ◽  
Vol 420 (1-3) ◽  
pp. 519-524 ◽  
Author(s):  
V.Kh. Alimov ◽  
B. Tyburska-Püschel ◽  
S. Lindig ◽  
Y. Hatano ◽  
M. Balden ◽  
...  

2018 ◽  
Vol 58 (4) ◽  
pp. 046011 ◽  
Author(s):  
Yihao Gong ◽  
Shuoxue Jin ◽  
Te Zhu ◽  
Long Cheng ◽  
Xingzhong Cao ◽  
...  

2011 ◽  
Vol 409 (1) ◽  
pp. 27-32 ◽  
Author(s):  
V.K. Alimov ◽  
B. Tyburska ◽  
M. Balden ◽  
S. Lindig ◽  
J. Roth ◽  
...  

2009 ◽  
Vol T138 ◽  
pp. 014048 ◽  
Author(s):  
V Kh Alimov ◽  
W M Shu ◽  
J Roth ◽  
K Sugiyama ◽  
S Lindig ◽  
...  

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