Modelling and simulation of hot-carriers degradation of high voltage floating lateral NDMOS transistors

1998 ◽  
Vol 38 (6-8) ◽  
pp. 1097-1101 ◽  
Author(s):  
Eric Vandenbossche ◽  
Catherine De Keukeleire ◽  
Marc de Wolf ◽  
Hugo Van Hove ◽  
Johan Witters
Keyword(s):  
High Voltage ◽  
Modelling And Simulation ◽  
Hot Carriers

Capacitance and tan δ measuring equipment for high voltage insulation modelling and simulation

2016 ◽  
Author(s):  
C.M. Gamage ◽  
J.M. Nupehewa ◽  
K.K.C.S. Kodikara ◽  
S.A.D. Chathuranga ◽  
R. Samarasinghe ◽  
...  
Keyword(s):  
High Voltage ◽  
Measuring Equipment ◽  
Modelling And Simulation ◽  
High Voltage Insulation ◽  
Tan Δ

Modelling and simulation of nozzle ablation in high-voltage circuit-breakers

2000 ◽  
Vol 33 (20) ◽  
pp. 2583-2590 ◽  
Author(s):  
D Godin ◽  
J Y Trépanier ◽  
M Reggio ◽  
X D Zhang ◽  
R Camarero
Keyword(s):  
High Voltage ◽  
Modelling And Simulation ◽  
Circuit Breakers

Modelling and Simulation of Power Devices for High-Voltage Integrated Circuits

2003 ◽  
pp. 401-412
Author(s):  
Rolf Hünlich ◽  
Günter Albinus ◽  
Herbert Gajewski ◽  
Annegret Glitzky ◽  
Wilfried Röpke ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
High Voltage ◽  
Modelling And Simulation ◽  
Power Devices

High Voltage Electron Microscopy of Ion-Milled Dental Enamel

1974 ◽  
Vol 32 ◽  
pp. 60-61
Author(s):  
L. D. Ackerman ◽  
S. H. Y. Wei
Keyword(s):  
Electron Microscopy ◽  
High Voltage ◽  
Third Molar ◽  
Polarized Light ◽  
Dental Enamel ◽  
Longitudinal Section ◽  
Ion Milling ◽  
High Voltage Electron Microscopy ◽  
Voltage Electron ◽  
High Voltage Electron

Mature human dental enamel has presented investigators with several difficulties in ultramicrotomy of specimens for electron microscopy due to its high degree of mineralization. This study explores the possibility of combining ion-milling and high voltage electron microscopy as a means of circumventing the problems of ultramicrotomy.A longitudinal section of an extracted human third molar was ground to a thickness of about 30 um and polarized light micrographs were taken. The specimen was attached to a single hole grid and thinned by argon-ion bombardment at 15° incidence while rotating at 15 rpm. The beam current in each of two guns was 50 μA with an accelerating voltage of 4 kV. A 20 nm carbon coating was evaporated onto the specimen to prevent an electron charge from building up during electron microscopy.

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