On calibration of a nominal structure–property relationship model for chiral sculptured thin films by axial transmittance measurements
2002 ◽
Vol 209
(4-6)
◽
pp. 369-375
◽
J.A. Sherwin
◽
A. Lakhtakia
◽
I.J. Hodgkinson
2000 ◽
Vol 40
(1)
◽
pp. 81-90
◽
Md Nuruddin
◽
Reaz A. Chowdhury
◽
Ryan Szeto
◽
John A. Howarter
◽
Kendra A. Erk
◽
...
2002 ◽
Vol 26
(3)
◽
pp. 245-251
◽
Qianfeng Li
◽
Lijun Dong
◽
Runping Jia
◽
Xingguo Chen
◽
Zhide Hu
◽
...
2013 ◽
Vol 29
(27)
◽
pp. 8694-8702
◽
Sida Luo
◽
Tao Liu
◽
Shermane M. Benjamin
◽
James S. Brooks
2019 ◽
Vol 558
◽
pp. 351-356
Yoshihiro Hayashi
◽
Yuki Marumo
◽
Takumi Takahashi
◽
Yuri Nakano
◽
Atsushi Kosugi
◽
...
2006 ◽
Vol 131
(11)
◽
pp. 1254
◽
Weiping Ma
◽
Feng Luan
◽
Haixia Zhang
◽
Xiaoyun Zhang
◽
Mancang Liu
◽
...
2013 ◽
Vol 55
(8)
◽
pp. 487-492
◽
Jianbo Tong
◽
Xiameng Xu
◽
Shuling Liu
◽
Ting Che
◽
Yunfei Li
◽
...
Franziska Hammerath
◽
Rantej Bali
◽
René Hübner
◽
Mira R. D. Brandt
◽
Steven Rodan
◽
...
2010 ◽
Vol 97
(16)
◽
pp. 162912
◽
Kyung Min Kim
◽
Min Hwan Lee
◽
Gun Hwan Kim
◽
Seul Ji Song
◽
Jun Yeong Seok
◽
...
2012 ◽
Vol 51
(18)
◽
pp. 6283-6289
◽
Sandrine Martin
◽
Helene Lepaumier
◽
Dominique Picq
◽
Jean Kittel
◽
Theodorus de Bruin
◽
...