Atomic force microscopic studies on the growth of self-assembled monolayers on SrTiO3-surfaces

1998 ◽  
Vol 327-329 ◽  
pp. 185-190 ◽  
Author(s):  
Boike L Kropman ◽  
Dave H.A Blank ◽  
Horst Rogalla
2010 ◽  
Vol 14 (07) ◽  
pp. 568-581 ◽  
Author(s):  
Megan Coates ◽  
Edith Antunes ◽  
Tebello Nyokong

Four new manganese(III) phthalocyanines (3a–d), octasubstituted at the peripheral position with pentylthio, decylthio, benzylthio, and phenylthio groups, respectively, were synthesized. Their specific electrochemical, spectroscopic and microscopic properties in solution and as self-assembled monolayers on gold were characterized. The UV-vis spectra confirmed red-shifted Q bands for all the complexes, due to the effect of the central metal and the electron-donating substituents. Three redox couples were visible during cyclic voltammetry studies for the four complexes, and spectroelectrochemistry confirmed the couples as corresponding to MnIIIPc-2/MnIIPc-2 (II) (metal reduction), MnIIPc-2/MnIIPc-3 (III) (ring reduction) and MnIIIPc-1/MnIIIPc-2 (I) (ring oxidation). Electrochemistry was also used to determine the blocking characteristics of the MnPc self-assembled monolayers on gold, which proved to be highly dependent on the type of substituent. Other methods of characterization included Raman spectroscopy, atomic force and scanning electrochemical microscopy analyses of the SAMs.


1999 ◽  
Vol 14 (6) ◽  
pp. 2464-2475 ◽  
Author(s):  
T. P. Niesen ◽  
M. R. De Guire ◽  
J. Bill ◽  
F. Aldinger ◽  
M. Rühle ◽  
...  

The surface morphology of TiO2- and ZrO2-based thin films, deposited from aqueous solution at 70–80 °C onto functionalized organic self-assembled monolayers (SAMs) on silicon has been examined using atomic force microscopy (AFM). The films have been previously shown to consist, respectively, of nanocrystalline TiO2 (anatase) and of nanocrystalline tetragonal ZrO2 with amorphous basic zirconium sulfate. The films exhibit characteristic surface roughnesses on two length scales. Roughness on the nanometer scale appears to be dictated by the size of the crystallites in the film. Roughness on the micron scale is postulated to be related to several factors, including the topography of the SAM and the effects of larger, physisorbed particles or agglomerates. The topographies of the oxide thin films, on both the nanometer and micron scales, are consistent with a particle-attachment mechanism of film growth.


2017 ◽  
Vol 28 (45) ◽  
pp. 455603 ◽  
Author(s):  
Hitoshi Asakawa ◽  
Natsumi Inada ◽  
Kaito Hirata ◽  
Sayaka Matsui ◽  
Takumi Igarashi ◽  
...  

2019 ◽  
Vol 10 ◽  
pp. 2449-2458
Author(s):  
Zhihua Fu ◽  
Tatjana Ladnorg ◽  
Hartmut Gliemann ◽  
Alexander Welle ◽  
Asif Bashir ◽  
...  

We present a new approach to study charge transport within 2D layers of organic semi-conductors (OSCs) using atomic force microscopy (AFM)-based lithography applied to self-assembled monolayers (SAMs), fabricated from appropriate organothiols. The extent of lateral charge transport was investigated by insulating pre-defined patches within OSC-based SAMs with regions of insulating SAM made from large band gap alkanethiolates. The new method is demonstrated using a phenyl-linked anthracenethiolate (PAT), 4-(anthracene-2-ylethynyl)benzyl thiolate. I–V characteristics of differently shaped PAT-islands were measured using the AFM tip as a top electrode. We were able to determine a relationship between island size and electrical conductivity, and from this dependence, we could obtain information on the lateral charge transport and charge carrier mobility within the thin OSC layers. Our study demonstrates that AFM nanografting of appropriately functionalized OSC molecules provides a suitable method to determine intrinsic mobilities of charge carriers in OSC thin films. In particular, this method is rather insensitive with regard to influence of grain boundaries and other defects, which hamper the application of conventional methods for the determination of mobilities in macroscopic samples.


2005 ◽  
Vol 871 ◽  
Author(s):  
Imma Ratera ◽  
Jinyu Chen ◽  
Amanda Murphy ◽  
Frank Ogletree ◽  
Jean M. J. Fréchet ◽  
...  

AbstractThe oligothiophene derivative (4-(5″″-tetradecyl-[2,2′;5′,2″;5″,2″′;5″′,2″″] pentathiophen-5-yl)-butyric acid (C14-5TBA) was synthesized and the structural and mechanical properties of self-assembled monolayers on mica have been studied by atomic force microscopy (AFM). The films were prepared by drop casting a dilute THF solution (1mM) of the oligothiphene on mica. Islands containing primarily monolayers with a very small percentage of multilayers were formed. The molecules adsorb through the carboxylic group, and expose the alkyl chain (CH2)13CH3. High resolution AFM scans reveal a well ordered structure of molecules with unit cell dimensions of 0.65 and 0.46 nm. Applying load to the tip, the molecular film was gradually compressed from an initial height of 4.1nm to a final one of 2.6 nm, corresponding to atilt of the alkyl chains. In regions covered with bilayers the molecules in the second layer were oriented opposite to those in the first layer, thus exposing the carboxylic end group to the air. These second layer was easily removed as the tip pressure increased.


Langmuir ◽  
1999 ◽  
Vol 15 (17) ◽  
pp. 5541-5546 ◽  
Author(s):  
Holger Schönherr ◽  
G. Julius Vancso ◽  
Bart-Hendrik Huisman ◽  
Frank C. J. M. van Veggel ◽  
David N. Reinhoudt

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